Product category:
ATE Systems
News Release from: Keithley Instruments | Subject: Model 4500-MTS
Edited by the Electronicstalk Editorial
Team on 21 November 2002
Modular ATE takes on active opto devices
The Model 4500-MTS is a modular test system for high-speed high-channel-count automated test applications.
The Model 4500-MTS is a modular test system for high-speed high-channel-count automated test applications Typical applications include testing fibre-optic telecommunication system components, such as tunable laser diodes, laser diode modules, Raman amplifier pump laser modules, and other active optoelectronic devices
This article was originally published on Electronicstalk on 4 May 2001 at 8.00am (UK)
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The Model 4500-MTS is the only open architecture modular test chassis with sufficient power source capability, throughput, and accuracy to lower the cost of manufacturing significantly, not just the cost of testing.
For a fully configured Model 4500-MTS chassis, the cost per channel is one-third that of conventional rack-and-stack solutions.
For even the system's minimal configuration (chassis and one plug-in card), the cost per channel is half that of the "resolution-equivalent" rack-and-stack system, while providing three times the throughput per channel.
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The Model 4500-MTS also lowers a user's total capital cost by reducing system integration expense and minimising the test equipment footprint.
Active fibre-optic components and modules have continued to evolve during the current downturn in the telecommunications market.
This evolution has led to more complex modules that support self-configuring networks, an essential feature for continued growth of fibre-optic telecommunications.
These new modules, such as tunable laser diodes and multiple-wavelength Raman pump modules, require more source and measurement channels in production test systems.
In the past, two or three channels of sourcing and measuring capacity were sufficient to characterise simple devices like laser diode modules.
Today and in the future, tens of channels will be required to characterise the next generation of active components.
This new "high channel count" demand is accompanied by the need for precision beyond the capacity of conventional modular test solutions.
The Model 4500-MTS addresses these test needs with a highly flexible and expandable test platform built on an open PCI backplane architecture with nine card slots.
When fully populated with Series 4500 QIVC Quad I-V cards, the system can simultaneously characterise the light-current-voltage (LIV) performance of 36 laser diodes in a multiple-head test fixture.
Conversely, the Model 4500-MTS can be configured to execute as many as eight separate hardware-synchronised test sequences, each running independently, on eight different test heads.
The precise drive current control, fast settling time, and high resolution make the Model 4500-MTS ideal for DC testing of laser diodes at all stages of production, including wafer level (VCSELs), bar stage (edge emitters), and finished product (laser diode modules).
While other modular platforms are designed for measurement and control, they lack the integral low noise, high current DC power source and distribution system of the Model 4500-MTS, which make possible its precision high speed sourcing and measuring capabilities.
The mainframe's Pentium-based PC and information display options provide flexibility to customise the system for a wide range of user devices and test programs.
The 19in rack-mountable chassis is 5U (8.75in) high and requires a fraction of the space used by rack-and-stack systems.
The chassis accepts a wide variety of third-party PCI cards for integrating additional test, measurement, and control functions.
The system's trigger bus simplifies intercard hardware synchronisation for Series 4500 cards.
The base configuration consists of a mainframe and at least one Quad I-V card.
The Model 4500-MTS/F mainframe is a PCI platform for source-measure cards (nine slots) with a built-in flat panel display and Pentium PC running Windows 2000.
The Model 4500-MTS/C mainframe is similar to the /F chassis, except without the flat panel display; one of the slots is occupied by a display card, reducing the usable slot count from nine to eight.
The Model 4500-QIVC low source current Quad I-V card provides ideal source ranges for characterising tunable laser diodes and VCSELs, as well as a 500mA range for transmitter modules and low power pump lasers.
Each of four channels provides a drive current source, Kelvin voltage measurements, and photocurrent measurement channels with programmable voltage bias.
The Model 4501-QIVC high source current Quad I-V card provides CW/DC testing up to 1A per channel, and higher currents by using up to four current source channels in parallel.
These features and high throughput dramatically reduce the cost of test for multiple-wavelength Raman pump modules, high output transmitter modules, and EDFA pump lasers.
The 4500-MTS chassis controller PC is compatible with many industry standard test development and execution environments, as are the Series 4500 card software drivers.
This open environment allows the test engineer to incorporate much of the test cell control into the 4500-MTS chassis, thereby reducing test system complexity.
If external instruments are needed, the Model 4500-MTS can be equipped with a GPIB card.
Also, USB instruments can be controlled with a built-in USB interface.
The Model 4500-MTS mainframes are available for order from 1st January 2003.
Shipments are planned to start on 1st March 2003. Request a free brochure from Keithley Instruments ...
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