Product category:
ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 16 September 2003
Toshiba chooses parametric test system
Toshiba Corp has selected the Keithley S630DC/RF parametric test system to support production of its newest generation of semiconductors.
Toshiba Corp has selected the Keithley S630DC/RF parametric test system to support production of its newest generation of semiconductors The selection by Toshiba's Advanced Logic Technology Department in Yokohama, Japan, identifies the Keithley system as the preferred parametric test platform
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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According to Tatsuo Noguchi, Senior Manager of Toshiba Corp Semiconductor Company, the S630 system will be instrumental in enabling the company to reduce its cost of test for its next generation of semiconductors, comprising 65nm CMOS devices.
Toshiba selected the Keithley technology due to its performance in a series of benchmarking tests, and because of the S630's ability to provide Toshiba with several key parameters: the most rapid measurement speeds, which will reduce the cost of test for Toshiba; most sensitive measurement capability, an important feature for testing semiconductor devices; and greater flexibility in software design, which will make it easier for Toshiba to integrate the new S630 systems into its existing manufacturing environment.
"This represents a significant endorsement of Keithley measurement technology by one of the industry's premier manufacturers", said Keithley chairman, president and CEO Joseph P Keithley.
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"Toshiba's record in consumer electronics manufacturing is impressive, and its passion for developing best-in-class production technologies is widely documented.
Their evaluation of the capabilities of our S630 system was demanding and detailed, which adds to the impact of this design win for our company".
"Keithley's technology will enable us to achieve more rapid throughput than before, a critical parameter for reducing our cost-of-test at our facilities", explained Tatsuo Noguchi.
"The ease of use this system provides, along with its powerful and flexible software, are important criteria that led us to recommend Keithley's systems as a standard to support our important new device technology".
Introduced in 2001, the Model S630DC/RF system is a single-insertion parametric test solution with RF options for probing communications and high-speed digital devices at the wafer level.
It allows single device testing up to 20GHz at rates up to ten times faster than typical rack-and-stack systems using separate DC and RF test operations.
It is a unique semiconductor test system in that it is one of the few in the world capable of making rapid measurements of both very low level DC and RF electrical signals.
This dual capability is particularly important for testing semiconductors used in the next generation of consumer electronics, which increasingly require integrated circuits that support RF frequencies to provide popular wireless, mobile and Internet features. Request free introductory details about products from Keithley Instruments ...
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