Product category:
Stand-Alone Instruments
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 07 October 2003
Pair target nanotechnology research
Keithley Instruments and Zyvex Corp have signed an agreement to work together to develop new solutions for the nanotech marketplace.
Keithley Instruments and Zyvex Corp have signed an agreement to work together to develop new solutions for the nanotech marketplace The agreement calls for the companies to share marketing, sales, and applications engineering resources as part of creating new solutions that combine Zyvex's nanomanipulator expertise with Keithley's technologies for ultra-low-level measurements
This article was originally published on Electronicstalk on 21 Aug 2008 at 8.00am (UK)
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The kind of low-level measurement expertise provided by Keithley is particularly critical in nanoscience applications.
Nanodevices are so small, that the electrical signals they produce are typically low.
Measuring these signals accurately demands high-sensitivity high-resolution instruments, such as those in Keithley's line of precision electrometers, picoammeters, and nanovoltmeters.
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Much of the technology that Keithley has developed for characterising semiconductor devices and test structures at the wafer level, including the Model 4200-SCS semiconductor characterisation system, is applicable to nanotechnology.
The Model 4200-SCS's subfemtoamp current measurement resolution and turnkey operation are ideal for researchers in fabrication facilities and labs developing nanodevices.
Its built-in Windows NT-based workstation and powerful Project Navigator software speed device test development, processing, and plotting.
Low current sensitivity, measurement flexibility, open architecture, and ease of use combine to make the Model 4200-SCS ideal for applications like I/V characterisation of single electronic transistors, molecular electronics and other nanodevices, and materials research.
The Zyvex family of nanomanipulation systems comprises flexible, cost-effective, modular R and D tools that are compatible with scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), focused ion beam (FIB) microscopes, optical microscopes, and probe stations.
These systems allow scientists to manipulate objects ranging in size down to the molecular level under a scanning electron microscope.
Zyvex contributes existing relationships within the nanotech community to this relationship, along with insight to the particular measurement requirements in this field.
Keithley's Model 4200-SCS system, when coupled with Zyvex's S100 nanomanipulator, will create a more comprehensive solution for scientists and engineers developing the next generation of nanostructures, nanomaterials, MEMS and other semiconductor structures.
"By drawing on the differing areas of expertise from both organisations, we'll be able to provide solutions that expand the market for both companies by integrating Zyvex's revolutionary probe technology with Keithley's low-level measurement proficiency", said Mark Hoersten, Keithley Vice President, Business Management.
"Our engineering and marketing staffs will work together to offer nanotechnology customers powerful, new solutions that neither company could provide on its own.
We're also confident we'll be providing test solutions no other measurement instrumentation supplier can offer".
"Our understanding of current and future research and development needs lets Zyvex maintain a competitive advantage in new product commercialisation, whether your aim is to study meso, micro, nano, or molecular based structures", said Thomas A Cellucci, PhD, Zyvex's Chief Operating Officer.
"We respond daily to inquiries from potential users in universities and industries all over the world who demand flexible scientific tools and value.
This cooperative arrangement will provide both Zyvex's and Keithley's customers with a far more effective solution than they've ever had before". Request free introductory details about products from Keithley Instruments ...
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