Product category:
ATE Systems
News Release from: Keithley Instruments | Subject: Test and measurement products
Edited by the Electronicstalk Editorial
Team on 10 December 2003
Catalogue brings full test range
together
Keithley Instruments has published its 2004 catalogue of test and measurement products for engineering development, production testing, and scientific research.
Keithley Instruments has published its 2004 catalogue of test and measurement products for engineering development, production testing, and scientific research In addition to detailed technical information, this comprehensive reference includes product selection guides to help instrumentation and test system buyers and specifiers decide which solution is best for their application and budget
This article was originally published on Electronicstalk on 20 Feb 2007 at 8.00am (UK)
Related stories
Test catalogue tutorials simplify selection
Keithley Instruments has published its 2007 Test and Measurement Product Catalogue.
Catalogue includes test system design tutorials
Keithley Instruments has published its 2006 test and measurement product catalogue.
The 432-page catalogue is conveniently arranged by major product type and application area.
Each section has a tutorial on test system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower their cost of testing.
The major catalogue sections are: DMMs and data acquisition systems; switch and control systems; power sources and RF power analysers; source and measure products; optoelectronic test instruments and systems; semiconductor test systems; low-current/high-resistance test products; low-voltage/low-resistance test products; and plug-in data acquisition boards New products in the 2004 catalogue include: the Model 2790-A SourceMeter airbag inflator DC electrical test system; the Model 2306-VS fast transient dual channel battery charger/simulator; Model 4510/4511 quad I/V cards for the Model 4500 modular test system (for high speed, high channel count automated applications, such as testing of RFICs and high brightness LEDs); and the Model S680DC/RF parametric tester (for high-resolution adaptive testing up to 40GHz using asynchronous parallel probing of IC wafers as large as 300mm). Request a free brochure from Keithley Instruments ...
• Keithley Instruments: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
