Visit the Low Power Radio Solutions web site
Click on the advert above to visit the company web site

Product category: ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial Team on 06 September 2004

Parametric test systems bound for Korea

Note: A free brochure or catalogue is available from Keithley Instruments about its services. Click here to request a copy.

Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems.

Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems The multi-million-dollar order represents tools for production process control of both 200 and 300mm wafers

"One reason the customer chose the S680 was because it demonstrated higher throughput in a head-to-head benchmark against the competition", stated Mark Hoersten, Keithley's Vice President for Business Development.

"Furthermore, the unique architecture of the S680 provided the integrated circuit (IC) maker with superior measurement results at the probe tip for better process control of its Flash memory devices".

Keithley's Model S680 DC/RF parametric test system, introduced in 2003, is designed for wafer-level parametric testing of advanced logic, memory, and analogue ICs.

In a single test system, it combines high DC sensitivity, femtoampere-level resolution, and RF s-parameter measurements up to 40GHz.

This provides the industry's highest throughput and a lower cost of ownership for measurements at the 90nm node and beyond. Request free introductory details about products from Keithley Instruments ...

• Keithley Instruments: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page

Search the Pro-Talk network of sites

Visit the Low Power Radio Solutions web site