Product category:
ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 24 January 2005
CD explains semiconductor reliability
testing
Keithley Instruments has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.
Keithley Instruments has released an interactive, tutorial CD on reliability testing for semiconductor test engineers "Understanding measurements: essential reliability testing techniques" provides information related to stress measure testing of semiconductor devices, new measurement techniques, and how to improve test throughput and maintain data integrity
This article was originally published on Electronicstalk on 17 Jun 2004 at 8.00am (UK)
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The CD, which is the second in Keithley's series of test and measurement knowledge CDs, can be ordered free of charge from the company's website.
The CD contains three web seminars that discuss a variety of testing issues in detail, including: understanding reliability testing of semiconductor devices; new measurement techniques for improving semiconductor device reliability; and how to improve throughput and data integrity - reliability issues and test challenges with gate oxide scaling.
Other material on the CD includes tutorial white papers covering issues related to materials testing and electromigration testing.
Several product application notes describe methods for conducting a wide range of semiconductor device tests, including charge pumping, oxide reliability, resistivity, hall voltage measurements, gate dielectric capacitance-voltage characterisation and high resistance measurements.
Useful resources include a glossary, a guide for choosing the best semiconductor reliability tool for specific test applications, and related web links. Request free introductory details about products from Keithley Instruments ...
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