Product category:
ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 07 February 2005
AMD signs for DC/RF parametric test
system
AMD has selected the Keithley Model S680 DC/RF parametric test system to support full production of advanced logic chips at its new state-of-the-art 300mm Fab 36 in Dresden, Germany.
AMD has selected the Keithley Model S680 DC/RF parametric test system to support full production of advanced logic chips at its new state-of-the-art 300mm Fab 36 in Dresden, Germany The benefits of the S680DC/RF system include advanced measurement capability, lower cost of ownership through higher throughput, and strong local service and support
This article was originally published on Electronicstalk on 21 Aug 2008 at 8.00am (UK)
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"AMD's selection of the Keithley Model S680 demonstrates the system's acceptance as the parametric tester of choice for wafer-level electrical measurements for process control during high-volume manufacturing", stated Mark Hoersten, Keithley's Vice President for Business Development.
"Manufacturers of both high-performance logic and high-performance analogue integrated circuits are increasingly turning to Keithley to supply electrical parametric testers for the next-generation processes they are implementing in their most advanced fabs".
"These include 90 and 65nm processes currently being deployed, along with their use in helping to develop the industry's most advanced 45nm processes".
First marketed in 2003, Keithley's Model S680 DC/RF tester is designed for wafer-level parametric testing of wireless communications and high-speed digital devices.
This tester dramatically increases overall throughput by combining two critical test functions in a single system - DC and RF tests can be combined in the same test sequence.
This integrated approach eliminates the long calibration and test times typical of separate RF test solutions.
It also eliminates the need for a separate, costly, RF-only prober.
Furthermore, capabilities unique to Keithley's test systems such as parallel test enable IC manufacturers to minimise their cost of test. Request free introductory details about products from Keithley Instruments ...
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