Product category:
ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 18 March 2005
Hynix signs for parametric test systems
Keithley Instruments has received a repeat multiple-system order for its S680 DC/RF parametric test systems from Hynix Semiconductor.
Keithley Instruments has received a repeat multiple-system order for its S680 DC/RF parametric test systems from Hynix Semiconductor Hynix is a leading Korean semiconductor manufacturer and one of the world's largest DRAM producers
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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The order includes testers for production process control of 300mm wafers being produced in Hynix's M3A fabrication facility, located in Icheon, Korea.
It also includes testers for production process control of 200mm wafers being produced in Hynix's M8/9 facility.
The systems will monitor the production of Hynix's Flash memory, DRAM, SRAM and system IC devices.
"Hynix continues to order our S680DC/RF testers because its earlier experience convinced its engineers that our systems offer both superior technical performance and a lower cost of ownership", stated William Yang, Keithley's Country Manager for its Korean operations.
"Our ability to combine fast test throughput, superior measurement integrity, and high cost-effectiveness is one of the major reasons the S680DC/RF is so widely accepted around the world".
"The repeat orders from semiconductor fabs for S680DC/RF systems validate the investment we've made to create a unique product that delivers leading-edge measurement capability without sacrificing ease of use", said Mark Hoersten, Keithley's Vice President for Business Development.
"Its unique architecture ensures superior measurement results at the probe tip for better process control of Flash memory devices, and provides upgrade flexibility as new processes and devices are developed".
Keithley's Model S680 DC/RF parametric test system, introduced in 2003, is designed for wafer-level parametric testing of advanced logic, memory, and analogue ICs.
In a single test system, it combines parallel testing capability, high DC sensitivity, femtoamp-level resolution, and RF S-parameter measurements up to 40GHz.
This provides the industry's highest throughput and a lower cost of ownership for measurements at the 65nm node and beyond. Request free introductory details about products from Keithley Instruments ...
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