Product category:
ATE Systems
News Release from: Keithley Instruments | Subject: Series 2600 System SourceMeter
Edited by the Electronicstalk Editorial
Team on 18 March 2005
New platform claims reduced component
test costs
Series 2600 System SourceMeter instruments comprise a new platform that significantly lowers the cost of test for a wide range of electronic component producers.
Series 2600 System SourceMeter instruments comprise a new platform that significantly lowers the cost of test for a wide range of electronic component producers, including silicon and compound semiconductor manufacturers Built on Keithley's third-generation source-measure technology (patent pending), the Series 2600 System SourceMeter instruments combine the highest throughput source-measure unit (SMU) in the industry with a scalable instrument form factor to allow seamless integration into systems from 1 to 16 SMU channels
This article was originally published on Electronicstalk on 10 Mar 2006 at 8.00am (UK)
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The Series 2600 System SourceMeter instruments, which consist of the single-channel Model 2601 and the dual-channel Model 2602, are the ideal modular, scalable instruments for building ATE systems to perform precision DC, pulse and low-frequency AC source-measure tests.
The Series 2600 System SourceMeter instruments provide industry-leading throughput rates via Keithley's new, unique embedded Test Script Processor (TSP).
TSP lets users program a sequence of test commands and execute high-speed automated test sequences independently of a PC operating system.
Further reading
First GPIB-controlled autotuning TEC tester
The Model 2510-AT autotuning TEC SourceMeter from Keithley Instruments is designed for testing and control of thermoelectric coolers (TECs) used in telecomms laser diode modules (LDMs).
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The Keithley Instruments Model 2520 pulsed laser diode test system is designed for electrical characterisation of laser diodes in either the chip/bar state or in finished modules.
Data acquisition upgrades to 32bit ActiveX
Keithley Instruments has released version 4.0 of its test and measurement data acquisition environment TestPoint.
Unlike competing products that lack this test sequencing ability or can only queue and execute commands, TSP features an intuitive intelligence that lets a 2600 Series instrument stand alone as a complete measurement automation solution for component testing.
The instrument can control sourcing, measuring, pass/fail decisions, test sequence flow control, component binning, and data storage on up to 16 SMU channels.
Testing shows a two- to four-times throughput advantage over competitive products in applications including three-terminal device test, parallel component test, L-I-V sweep and two-terminal device test.
Flexible triggering and flow control capability allows TSP to control other instruments, component handlers, or probers via digital I/O and RS232 ports.
With its unparalleled instrument automation capability, TSP achieves up to 10x greater test throughput over legacy products.
The Series 2600 System SourceMeter instruments are equipped with Test Script Builder development software.
Its simple graphical user interface lets users develop, modify, and debug high-speed TSP programs.
Each unit also features a built-in suite of prewritten TSP programs that can be quickly modified for specific applications, cutting software development time by as much as 75%.
In addition, Lab-Tracer 2.0 software for Series 2600 System SourceMeter instruments enables easy instrument control, data acquisition, and curve tracing in lab or device characterisation applications.
TSP-Link, another new Keithley technology, functions as a trigger synchronisation and inter-unit communication bus to allow a single TSP program to seamlessly control 16 or more SMU channels without hubs or bulky cables.
With very little network overhead and a 100Mbit/s datarate, it is significantly faster than GPIB and 100Base-T Ethernet in real applications.
TSP-Link affords users the advantage of scalability without the wasted rack space and added cost of main-frame systems.
Series 2600 instruments offer the industry's highest SMU rack density with up to two SourceMeter channels in a single half-rack, 2U chassis.
Each channel offers a 40W, 3A precision four-quadrant SMU with accurate voltage and current read-back and 1pA resolution that can be configured as a precision power supply, current source, bipolar bias source, 5.5-digit DMM, low-frequency arbitrary waveform generator with measurement, and electronic load.
At about $4000 to $5000 per channel, this combination of functions in one unit dramatically reduces the cost of ownership.
An easy-to-use front-panel knob simplifies program editing and navigating while set-it and forget-it voltage and current limits work similar to a power supply.
The high throughput, flexible, and scalable Series 2600 System SourceMeter instruments are suitable for a wide range of applications in functional test and R and D environments.
Units can perform I/V functional test and I/V characterisation of a wide range of integrated devices and components including discrete and passive devices, and SSI and LSI devices such as ASICs, SoCs and RFICs.
In R and D environments, units can perform device characterisation to aid in materials research for device development.
Availability is two weeks ARO from May 2005. Request a free brochure from Keithley Instruments ...
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