Product category:
ATE Systems
News Release from: Keithley Instruments
Edited by the Electronicstalk Editorial
Team on 14 July 2005
Handbook answers semiconductor test
challenges
"Overcoming the measurement challenges of advanced semiconductor technologies: DC, pulsed and RF - from modelling to manufacturing" is a new semiconductor test reference handbook.
Keithley Instruments has published a semiconductor test reference handbook titled "Overcoming the measurement challenges of advanced semiconductor technologies: DC, pulsed and RF - from modelling to manufacturing" The 140-page handbook describes emerging measurement challenges for semiconductor manufacturers as they move into the 65nm technology node and beyond
This article was originally published on Electronicstalk on 19 Jun 2008 at 8.00am (UK)
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The handbook draws from the collective experience of Keithley's parametric test and device characterisation experts and the company's customers.
It covers a variety of emerging technologies and processes, such as: challenges in RF wafer testing; gate dielectric reliability testing; charge pumping and reliability; high frequency capacitance measurement; copper via testing; and advanced SMU DC measurements.
The handbook also contains a glossary of commonly used terms in the semiconductor industry, including test and measurement terminology. Request free introductory details about products from Keithley Instruments ...
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