Test system has IEEE nanotube standard covered
The Model 4200 semiconductor characterisation system conforms to and supports the just-released IEEE standard for electrical testing of carbon nanotubes.
Keithley Instruments' Model 4200 semiconductor characterisation system conforms to and supports the just-released IEEE standard for electrical testing of carbon nanotubes.
The recently approved IEEE1650TM-2005 standard, known as "Standard methods for measurement of electrical properties of carbon nanotubes", gives the burgeoning nanotechnology industry one uniform and common set of recommended testing and data reporting procedures for evaluating the electrical properties of carbon nanotubes.
The Model 4200 is a core measurement platform for engineers involved in nanotech materials research.
A carbon nanotube is a tubular structure that has become a major focus of nanomaterials research because it displays a variety of exciting properties for creating nanoscale, low power consumption electronic devices.
A nanotube can even act as a biological or chemical sensing device in some applications, or as a carrier for individual atoms.
Keithley Instruments provided the standards committee with a variety of testing apparatus recommendations and measurement practices for making electrical measurements on carbon nanotubes in order to minimise and/or characterise the effect of measurement artifacts and other sources of measurement error encountered when making measurements on carbon nanotubes.
The new testing standard should aid in the commercialisation of nanotubes by providing uniformity between lab researchers and design engineers eager to put lab results into commercial use on the production line.
Recommended measurement data to report as specified in the new standard include electrical resistivity, conductivity, carrier mobility, and nonlinear behaviours.
A number of key international test and measurement and carbon nanotube leaders from industry, academia and government organisations sat on the IEEE committee.
Jonathan Tucker, the standard's Secretary and representative from Keithley says: "The new standard will greatly aid in accelerating the commercialisation of nanoscale materials and electronic devices for the semiconductor industry, along with many other industries".
"Customers buying carbon nanotubes can now speak the same language as vendors when it comes to the electrical properties and quality of the products they're purchasing".
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications.
Keithley Instruments is a world leader in the creation of electrical measurement solutions for nanotechnology.
Nanotechnology requires the measurement of very small currents and voltages, capabilities that Keithley has pioneered for 60 years.
With their unequalled performance, Keithley's measurement tools enable nanotechnology researchers to observe phenomena that were impossible just a few years ago.
Keithley is seen by many nanotechnologists as a key enabler of their work.
These researchers depend on Keithley's measurement expertise and knowledge to help them unlock the secrets at the nanoscale level and accelerate the jump from the nanotech research lab to commercial production.
Not what you're looking for? Search the site.
Tel +49 89 849307 0
-
Software upgrades semiconductor characterisation
Novel features include software support for characterising higher power semiconductor devices at up to 200V DC (or 400V differential) and up to 300mA. -
Semiconductor tester gains extra capabilities
Significant enhancements to a Semiconductor Characterisation System enable new features like Flash memory testing, high-power RF device testing, and pulse testing for advanced semiconductor materials. -
Upgrade for semiconductor characterisation
KTE Interactive V6.1 is an updated version of the powerful measurement software for the Model 4200-SCS semiconductor characterisation system. -
Characterisation system gains pulse capabilities
Keithley Instruments now offers pulse generation and measurement in its Model 4200-SCS semiconductor characterisation system. -
Characterisation package goes further
New from Keithley Instruments is the Model 4200-SCS semiconductor characterisation system with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.
Categories
- Active Components (11,917)
- Passive Components (2,949)
- Design and Development (9,394)
- Enclosures and Panel Products (3,246)
- Interconnection (2,841)
- Electronics Manufacturing, Production, Packaging (3,055)
- Industry News (1,898)
- Optoelectronics (1,616)
- Power Supplies (2,297)
- Subassemblies (4,551)
- Test and Measurement (4,956)