Source-measure units raise current and voltage

Keithley Instruments has made two new additions to its Series 2600 System SourceMeter instruments.

Keithley Instruments has made two new additions to its Series 2600 System SourceMeter instruments.

The Models 2611 and 2612 add higher voltage and higher current capabilities to Keithley's revolutionary source-measure unit (SMU) platform introduced last year, significantly lowering the cost of test for a wide range of electronic components.

The 200V and 10A capabilities of the two new models make them ideal for functional test and I/V characterisation of silicon and compound semiconductor devices like FETs, diodes, voltage regulators, and optoelectronic components.

In line with the other Series 2600 System SourceMeter Instruments, the Models 2611 and 2612 combine the highest throughput SMU technology available with a compact and scalable form factor that allows seamless integration into systems from one to 16 SMU channels.

The Models 2611 and 2612 are designed specifically to satisfy electronic manufacturers' needs for cost effective automated systems that rapidly test low to medium pin count devices or multiple devices in a production test fixture.

The Model 2611 is a single-channel SMU, and the Model 2612 is a dual-channel unit.

Multiple units can be integrated seamlessly with a unique embedded Test Script Processor (TSP) and TSP-Link.

These technologies let users program and execute high-speed, automated test sequences across multiple channels, independent of a PC operating system and its associated communication delays.

This allows test speeds up to ten times faster than conventional test instruments.

With two channels and a 200V source range, the Model 2612 is capable of 400V differential operation, and each SMU channel is capable of 1.5A DC and 10A pulsed output.

Both models have a new contact check feature that is being added to the entire Series 2600 Instrument Line.

This feature eliminates false failures in high speed test applications by ensuring that all connections to the devices under test are intact before a source-measure sequence is initiated.

The net result is an ideal modular, scalable instrument platform for building ATE systems that performs precision DC, pulse, and low-frequency AC source-measure tests.

The Series 2600 System SourceMeter Instruments offer single- and dual-channel capability and are scalable into larger automated systems using new TSP-Link technology.

TSP-Link was developed by Keithley to function as a trigger synchronisation and inter-unit communication bus, allowing a single TSP program to control up to 16 or more SMU channels, with a theoretical system maximum of 128 channels.

It is optimised for small message transfers that are characteristic of test and measurement applications.

With very little network overhead and a 100Mbit/s datarate, it is significantly faster than GPIB and 100BaseT Ethernet in real applications.

TSP-Link allows multiple Series 2600 units to be connected for seamless integration into systems without hubs or bulky cables.

Connected units can be programmed and controlled as if they were a single free-standing ATE system.

TSP-Link gives users the advantage of scalability without the wasted rack space and added cost of mainframe systems.

Keithley's TSP technology dramatically increases test throughput in high speed automated systems.

The Models 2611 and 2612 are capable of storing and running hundreds of predefined device tests that make limit comparisons, perform conditional test program branching, and work with or without a PC controller during test execution.

The units' digital I/O can directly control component handlers and other instruments.

This greatly reduces the delays associated with GPIB traffic on the data communications bus and PC operating system overhead.

In addition, seamless range changes in these new instruments significantly speed up test sequences that cover multiple ranges on an SMU.

The contact check feature further speeds testing by eliminating false failure indications due to bad connections that can trigger operator intervention or useless component handler sequences.

Depending on the device under test, test time reductions of 10x are possible compared with older sequencing instruments, and 2x to 4x test time reductions are common in component test applications.

In the past, developing multi-instrument automated systems for basic R and D or high speed production test application has been a challenge.

Keithley solves this problem with two free software tools that greatly simplify systemisation of the Series 2600 SourceMeter Instruments.

For R and D and curve tracing applications, Keithley's LabTracer 2.0 software controls up to eight SourceMeter channels to perform automated tests with no programming whatsoever.

This software allows the user to fully configure SourceMeter channels, run device parameter tests, and plot test data simply and easily.

For high-speed production applications, TSP provides a truly simple programming interface with an uncomplicated command language similar to Basic programming.

Many examples are provided from the factory as built-in test scripts.

Additional example programs are available from the Keithley website.

Test Script Builder software, an integrated development environment for TSP, is provided at no charge and allows system designers to create and debug customised test scripts quickly and easily.

Studies have shown that by using TSP and its associated software, users can cut system development time by 50% to 75% compared with previous generations of test sequencing instruments.

The 200V, 10A pulsed capabilities of the Models 2611 and 2612 greatly expand the application range of the Series 2600 SourceMeter Instruments.

Moreover, the pulse generator and low frequency arbitrary waveform generator capability of these units can be applied to each SMU channel.

This greatly simplifies complex testing requirements by providing a universal analogue I/O pin for a wide range of applications involving active and passive components.

When coupled with TSP-Link scalability, the result is unmatched accuracy and low noise data in high-speed multi-channel testing for almost any production setting.

In summary, the Series 2600 lowers ownership costs by facilitating scalable optimised systems (ie lowering capital costs), reducing test times, shortening system development time, and providing application flexibility.

These SMUs can quickly add new capabilities and capacity to existing test stands and lower capital investment in new stands.

Straightforward scalability, simple system integration, and small test stand footprints let Series 2600 users avoid the high cost of custom designed turnkey equipment while increasing flexibility, performance, and reliability.

Evolving test requirements are easily accommodated with a minimum of SMU hardware changes - users can standardise on one or two SMU models and re-purpose them by simply changing test scripts.

Availability of Model 2611 and Model 2612 is 12 weeks after receipt of order.

Back to top