Product category:
ATE Systems
News Release from: Keithley Instruments | Subject: S600 Series
Edited by the Electronicstalk Editorial
Team on 20 July 2007
Parametric test systems make switch to
Linux
More stable OS and longer service life for computer reduces need for customers to qualify new workstations and upgrade software and hardware resources.
Keithley Instruments has upgraded its S600 Series of parametric test systems, including migrating the testers' embedded controllers to the Linux operating system This provides a more stable OS and longer service life for the computer, reducing the need for customers to qualify new workstations and upgrade software and hardware resources
This article was originally published on Electronicstalk on 19 Jul 2007 at 8.00am (UK)
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Parametric testers add probe card support
FormFactor's probe cards will be used with Keithley S600 Series parametric testers to measure very low-level DC currents.
Higher throughput for wafer test equipment
The S680DC/RF parametric test system is the latest addition to the Keithley Instruments S600 Series family.
In addition, firmware upgrades will provide throughput improvements compared with the earlier Unix-based systems.
A new software licensing method incorporates a hardware key for each tester in the form of a USB stick, which can be transferred from workstation to workstation for fast repair times.
Keithley's parametric test systems with Linux controllers join the growing list of semiconductor equipment types that now use the Linux OS.
With its RF and parallel test options and appropriately designed test structures and probe cards, the Model S680 is the only RF test system on the market that can make simultaneous DC and RF measurements in parallel within the same probe touchdown.
This yields substantially higher throughput than similar methods that perform sequential DC measurements followed by RF measurements.
The Model S680 system using the new Linux controller will be compatible on a mixed system test floor.
For customers who prefer a 100% Linux test floor, field upgrades are available.
In any case, a newly installed Linux controller will operate seamlessly with existing parametric test systems operating under Solaris.
Those purchasing Keithley's new S600 Series systems will get the latest software version, KTE V5.2.2, which is also available as a field upgrade.
The new systems will have Red Hat Enterprise Linux WS Version 4, Update 4, and a new x86-based computer.
Aside from the RF and parallel test options, these systems can also be purchased with the adaptive test option and 300mm wafer automation option.
Because the GUI is similar to that in earlier systems, minimal, if any, additional operator training is needed.
Upgrades and new systems will be available for delivery starting September 2007. Request a free brochure from Keithley Instruments ...
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