Instruments cut test times

The 2635 and 2636 operate as an SMU (source-measure unit), a DMM (digital multimeter), bias source, low frequency pulse generator, and arbitrary waveform generator.

Keithley Instruments has added the 2635 and 2636 models to its to its series 2600 range of SourceMeter parametric test instruments.

Their instrument-based, multi-channel architecture results in a 50% lower cost than typical mainframe-based source-measure solutions.

With their test script processor (TSP) and TSP-link intercommunications bus, these instruments enable engineers to quickly create fast test systems that are ideal for research, characterisation, wafer sort, reliability, and production monitoring applications.

The 2635 and 2636 provide cost-effective DC and pulse testing from fA and uV up to 200V/1.5A.

They operate with or without a PC, providing test speeds up to four times faster than typical mainframe-based source-measure solutions.

Moreover, each includes a PC-like microprocessor to enable easy programming and independent execution of test programs (scripts) ranging from the simple to complex, including sourcing, measuring, test sequence flow control, and decisions with conditional program branching.

Since they can be easily integrated with other instruments in automated systems, they are suitable for component manufacturers and semiconductor fabricators for wafer level testing and packaged device testing.

At the same time, their low cost makes them attractive to researchers and academics in a wide variety of disciplines that require fast and easy IV characterisation of devices and materials.

The 2635 and 2636 enable users to significantly reduce their cost of test for low and medium pin count devices or multiple devices and material samples.

They operate as five precision instruments in a single box: an SMU (source-measure unit), a DMM (digital multimeter), bias source, low frequency pulse generator, and arbitrary waveform generator.

These functions are controlled by TSP, which enables fully programmable sequences to be downloaded and executed within the instrument.

This eliminates communications and PC overhead for critical throughput gains, while allowing complete flexibility in controlling and adapting to different test situations.

In addition to TSP, Keithley's TSP-Link master/slave connection provides a high-speed, low-latency interface to other TSP-based instruments, enabling simple multi-box and multi-instrument software control.

A major benefit is easy scalability of series 2600 test systems according to present and future needs.

Multiple single-channel (Model 2635) units and dual-channel (Model 2636) units can be integrated seamlessly without a host mainframe.

This mainframeless scalability allows system sizes up to 32 channels per GPIB address, while minimising cost, rack space, and time required when adding future channels.

Users can standardise on two or three SMU models to cover tests up to 10A pulse or 3A DC in a wide range of applications.

The SMUs can then be repurposed by simply changing the test scripts they execute.

All of Keithley's TSP-based systems are capable of storing and running thousands of lines of code for predefined device tests that include limit comparisons, pass/fail decisions and parts binning.

The systems all work with or without a PC controller during test execution.

Furthermore, their digital I/O can directly control probers, handlers, and other instruments, while the TSP-Link allows users to execute high-speed automated tests across multiple channels and instruments without GPIB traffic.

This results in test time reductions as large as 10X compared to older sequencing instruments.

When the 2635 and 2636 are combined with Keithley's 3700 system switch/multimeter instruments, which also incorporate TSP and TSP-Link, an even broader range of high-speed applications can be served.

Together, these two product series provide the fundamental building blocks that enable tightly integrated switching and multi-channel IV measurements.

Test engineers can use them to easily create low-cost ATE systems optimised for high throughput in applications such as semiconductor stress testing and functional packaged device tests.

Historically, it has been a challenge to develop multi-instrument characterisation or ATE systems for basic R and D and high-speed production testing.

Keithley solves this problem with two free software tools that greatly simplify systemisation of the series 2600 SourceMeter Instruments.

For R and D and curve tracing applications, Keithley's LabTracer 2.0 software controls up to eight SourceMeter Instrument channels to perform device characterisation with no programming whatsoever.

This software allows the user to fully configure each channel, run device parameter tests and plot test data.

For high-speed production applications, the test script processor is programmed with an uncomplicated Basic-style programming language that runs in real-time on the instrument.

The interface is compatible with all the popular programming languages.

Keithley provides built-in test scripts for sweeping, pulsing, waveform generation and common component tests.

A number of test scripts are included in the instrument, while others can be downloaded at no charge.

These pre-written factory test scripts can be used as supplied or easily customised, allowing production users to get their systems up and running faster than ever.

Users can develop custom test scripts in other ways, including a free programming tool called Test Script Builder that helps users create, modify, debug, and store TSP scripts using its simple command language.

The user's scripts can be downloaded from the PC to the master SourceMeter instrument and saved in its nonvolatile memory.

16Mbyte of total storage allows up to 50,000 lines of TSP code and more than 100,000 readings.

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