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ATE Systems
News Release from: Keithley Instruments | Subject: 200-CVU instrument
Edited by the Electronicstalk Editorial
Team on 10 October 2007
System provides easy CV measurements
Keithley Instruments' 4200-CVU instrument is designed for the company's 4200-SCS semiconductor characterisation system.
Keithley Instruments has released a CV measurement instrument for its 4200-SCS semiconductor characterisation system The 4200-CVU instrument comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10kHz to 10MHz
This article was originally published on Electronicstalk on 21 Aug 2008 at 8.00am (UK)
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The 4200-CVU provides intuitive point-and-click setup, simple cabling and built-in element models that eliminate the guesswork in obtaining valid CV measurements.
Users of all experience levels can perform CV tests as if they were experts.
The 4200-CVU includes the most extensive set of test libraries available, greatly increasing test efficiency.
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Novel features include software support for characterising higher power semiconductor devices at up to 200V DC (or 400V differential) and up to 300mA.
Cards expand test configuration options
Keithley Instruments has expanded its Series 3700 system switch/multimeter and plug-in card family with the addition of two new plug-in cards.
Keithley's 4200-LS-LC-12 is a special switch matrix and card with cables and adapters that enable tightly integrated C-V/IV testing with a single prober touchdown.
The optional 4200-Prober-Kit allows easy connection of the Model 4200-SCS to the most widely used probers.
The 4200-CVU and optional modules solve the problems of other characterisation systems that either do not provide integrated C-V/I-V/pulse, or have limited support in their user interfaces and software libraries.
The system's flexible and powerful test execution engine makes it simple to combine I-V, CV and pulsed tests into the same test sequence.
The 4200-SCS can replace a variety of electrical test tools with a single, tightly integrated characterisation solution.
Nonetheless, Keithley's 4200-SCS will continue to support C-V/I-V/pulse and other test methodologies using a variety of third-party instruments.
These characteristics make the 4200-SCS/CVU suitable for semiconductor technology development/process development/reliability labs, aterials and device research labs and consortia, and any lab needing a benchtop DC or pulse instrument.
Keithley supports the 4200-CVU hardware with a set of sample programs, test libraries and built-in parameter extraction examples ready to run right out of the box.
The eight software libraries provide the broadest range of CV test and analysis available.
They cover all the standard applications, including C-V, C-t and C-f measurement and analysis for high and low K structures, MOSFETs, BJTs, diodes, Flash memory, photovoltaic cells, IIIV compound devices and carbon nanotube (CNT) devices.
Besides junction, pin-to-pin and interconnect capacitance, the analysis and parameter extraction software yields doping profiles, TOX, mobile ions and carrier lifetime.
These tests include various linear and custom CV sweeps, as well as C versus time and C versus frequency.
Unlike other characterisation systems, the Keithley C-V/IV analysis and extraction programs operate in a well-documented open environment, allowing users to easily make modifications and customise their routines.
Integrated sample projects, developed from the deep application knowledge of Keithley engineers, help shorten program development time.
The Model 4200-CVU also comes with a variety of advanced diagnostic tools to help ensure the validity of CV test results.
Users who are uncertain if a test result is accurate just need to click the on-screen "Confidence Check" button, or use the real-time front panel to isolate portions of the test setup for validation.
The 4200-CVU can improve users' productivity significantly, whether the task is as simple as setting up a single measurement or running a preset test sequence with a single mouse-click, or as sophisticated as triggering and plotting multiple CV sweeps.
The system's high-speed digital architecture means the 4200-CVU can run and plot CV sweeps in real time faster than any competitive CV meter.
In addition to I-V/C-V/pulse testing in one flexible, fully integrated test environment, Model 4200-SCS users have several other options.
These include a choice of up to eight medium or high-power DC source-measure units (SMUs), dual-channel pulse and waveform generators and an integrated digital oscilloscope.
Like the 4200-CVU, all of these instruments plug into the 4200-SCS instrument slots and are controlled by the Keithley Test Environment Interactive (KTEI, version 7.0) software environment.
This point-and-click interface streamlines test setup, test sequence control and data analysis.
KTEI can also control a variety of external instruments, including most probers, hot chucks and test fixtures, as well as Keithley's high-integrity switch matrices, which provide the widest connection flexibility available in the industry.
Many instrument manufacturers produce a continuous stream of products that are not compatible with each other and a new product often signals the end of a previous offering - leaving no investment protection.
Keithley's policy of continual hardware and software upgrades to the 4200-SCS means that the 4200-CVU module, along with all associated software and optional hardware, can be retrofitted to the first 4200-SCS ever built.
This easy upgrade path eliminates the need to buy a new parametric analyser every few years to keep pace with innovations in device or materials technology.
Systems can be upgraded cost-effectively to keep up with the industry's evolving test needs, so capital investments in the 4200-SCS stretch further than in competitive test solutions.
Furthermore, external hardware and test program development is held to a minimum. Request a free brochure from Keithley Instruments ...
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