Product category:
ATE Systems
News Release from: Keithley Instruments | Subject: Semiconductor device test applications guide
Edited by the Electronicstalk Editorial
Team on 09 May 2008
CD guide explains semiconductor testing
The CD that also includes a large variety of semiconductor test application information such as applications notes, white papers and presentations.
Available now free of charge from Keithley Instruments, the "Semiconductor device test applications guide" comes on a CD that also includes a large variety of semiconductor test application information such as applications notes, white papers and presentations designed to help users to reduce their cost of test while simplifying the most challenging applications The guide itself is divided into six main sections with topics including: two-terminal device tests, bipolar transistor tests, FET tests, substrate bias and high-power tests
This article was originally published on Electronicstalk on 4 May 2001 at 8.00am (UK)
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The "Semiconductor device test applications guide" features more than a dozen application notes on topics such as on-the-fly threshold-voltage measurements for bias temperature instability characterisation, increasing production throughput of multipin devices, optimising switched measurements, white papers on test sequencing instruments and the fundamentals of the LXI communication protocol, six presentations and an appendix of test scripts. Request a free brochure from Keithley Instruments ...
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