Burn-in tester boosts memory module reliability

Kingston Technology has developed a proprietary test platform designed to detect early-life failure (ELF) in server memory modules.

Kingston Technology, the independent world leader in memory products, today announced a technology advancement with the development of the KT2400 tester: a patent-pending, proprietary testing platform designed to detect early-life failure (ELF) in server memory modules, taking quality assurance for server memory to a new level of excellence.

Memory plays a critical role in server performance and if a server goes down it can cost a company millions.

"Our development of the KT2400 dynamic burn-in testers puts modules through the most stringent battery of tests, simulating the most demanding server environments, so marginal modules are weeded out at the earliest stages", said Thomas Marschner, Vice President, Sales and Marketing Europe, Kingston Technology.

"Kingston Technology can continue to lead the way with server memory quality and reliability", continued Marschner.

The most common type of memory failure is early-life failure (ELF) which happens when a module's electronic components cease to function during the first three months of normal operation.

Failures outside the ELF window are rare.

In their relentless pursuit for memory quality, Kingston Technology engineers devised a burn-in testing process that simulates the ELF period, thus screening out unreliable modules before they leave the facility.

Using specially designed testing boards called advanced pattern testing controllers, each KT2400 tester can test up to 500 modules simultaneously.

During the testing process server modules are subjected to high-heat, high-stress and high-voltage environments and all memory cells are continuously exercised, in effect simulating aging the modules by at least three months.

Once Kingston Technology engineers developed the KT2400 testing platform, the testers were placed in a six-month trial, testing 100% of Kingston Technology's server memory.

Data were compiled and closely analysed.

Using the KT2400 tester reduced ELF failures by 90%, far exceeding expectations - representing significant improvement to a product line already considered at the top of its class.

"The KT2400 burn-in testers represent a significant leap in achieving the ultimate in server reliability: zero downtime", added Marschner.

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