Product category:
ATE Systems
News Release from: Kingston Technology
Edited by the Electronicstalk Editorial
Team on 28 July 2005
Dynamic burn-in tester wins US Patent
Kingston Technology has been granted a US Patent for its KT2400 dynamic burn-in tester.
Kingston Technology has been granted a US Patent (6,910,162 B2) for its KT2400 dynamic burn-in tester This proprietary testing platform is designed to detect early-life failures (ELF) in server memory modules, taking quality assurance to a new level of excellence
This article was originally published on Electronicstalk on 18 Nov 2004 at 8.00am (UK)
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Originally intended as a tester for server memory modules, the Kingston Technology KT2400 tester can be adapted to test a wide variety of memory module standards.
"We're delighted at winning the patent for the KT2400", said Dr Ramon Co, VP, Worldwide Test Engineering, Kingston Technology and co-inventor of the KT2400 tester.
"In the early stages of designing the KT2400, our mission was to create a tester that would put modules through the most stringent battery of tests, simulating the most demanding server environments", continued Dr Co.
"The most common type of memory reliability failure is early-life failure (ELF) which is defined as a failure that occurs during the first three months of normal operation".
"Our goal was to design a tester that would simulate the ELF period and weed out any marginal modules", added Dr Co.
Using specially designed testing boards called Advanced Pattern Testing Controllers, each KT2400 tester can test up to 500 modules simultaneously.
During the testing process, server modules are subjected to a high-heat, high-stress and high-voltage environment with all memory cells continuously exercised for a specified period of time.
The testing process accelerates the life of the modules thereby simulating three months of normal operation.
Hence, marginal modules that would otherwise fail in the field are screened in the factory prior to shipment.
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