Free seminars address serial data anaysis
A
LeCroy product story
Edited by the Electronicstalk editorial team
Jan 12, 2006
A pan-European seminar tour on "Expanding your vision on serial data analysis capabilities" will cover 12 different locations between mid February and March 2006.
LeCroy has organised a pan-European seminar tour on "Expanding your vision on serial data analysis capabilities" covering 12 different locations between mid February and March 2006.
Both physical layer quality measurements as well as protocol layers measurements will be part of this one-day free-of-charge seminar events.
The benefits of using new technologies on acquisition for both real-time signals and repetitive signals up to 100GHz will be demonstrated with a particular focus on jitter breakdown and all the statistical quality measurement on the physical layer.
Protocol analysis will be focus on PCI-Express, SAS/SATA, USB and Bluetooth with practical measurement demonstration of the wireless-USB on the ultrawideband (UWB) radio platform.
More details and registration are available on the LeCroy website.
Not what you're looking for? Search the site.
Categories
- Active Components (11,917)
- Passive Components (2,949)
- Design and Development (9,394)
- Enclosures and Panel Products (3,246)
- Interconnection (2,841)
- Electronics Manufacturing, Production, Packaging (3,055)
- Industry News (1,898)
- Optoelectronics (1,616)
- Power Supplies (2,297)
- Subassemblies (4,551)
- Test and Measurement (4,956)
