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LogicVision Europe
Address:
Po Box 38857
London
W12 9X
UK
Telephone: (UK) +44 208 740 5504
http://www.logicvision.com
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Listing of all 29 news releases from LogicVision Europe:
eDRAM tester supports new options
Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS.
News from LogicVision Europe (17 October 2007)
Increasing interest spurs LogicVision
LogicVision has announced its financial results for the first quarter of 2007, ended 31st March 2007.
News from LogicVision Europe (26 April 2007)
Distributor appointment expands Japanese support
LogicVision has signed up Noah Corporation as distributor for its products in Japan.
News from LogicVision Europe (21 March 2007)
Distribution deal expands N European coverage
LogicVision has appointed ISS Group to distribute its products in the UK, Norway, Poland, Finland, Ireland, Denmark and Sweden.
News from LogicVision Europe (23 February 2007)
Wintegra signs up for memory BIST
Wintegra has selected LogicVision's leading-edge memory BIST solution, ETMemory, to help it meet its silicon manufacturing quality goals.
News from LogicVision Europe ( 6 February 2007)
Tundra takes quick route to IEEE1149.6
User application article LogicVision's ETBoundary product provides a boundary scan solution for embedded test and diagnosis of integrated circuit pin functions and board-level interconnect.
News from LogicVision Europe (20 December 2006)
Software cuts test development cycles
LogicVision has announced the release of a new production version of the ETAccess family of products, offering integrated data-logging capabilities.
News from LogicVision Europe (19 December 2006)
Diagnostic software works with Teradyne testers
Teradyne and LogicVision have established seamless interaction between LogicVision's ETAccess semiconductor diagnostic products and Teradyne UltraFlex test systems.
News from LogicVision Europe (19 December 2006)
Expanded use of embedded test solutions
User application article LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs.
News from LogicVision Europe (14 December 2006)
Embedded memory tests aid parallel processing
User application article Rapport has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products.
News from LogicVision Europe ( 5 December 2006)
Software adds more insight into yield data
Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data to provide detailed sub-die-level failure and performance monitoring capabilities.
News from LogicVision Europe (24 October 2006)
Design-for-test tool runs at-speed
LogicVision has unveiled its ScanBurst tool and has partnered with Mentor Graphics to deliver a unique and improved at-speed test solution for high-speed nanometre designs.
News from LogicVision Europe (24 October 2006)
Sequoia puts RF IC yield data to good use
User application article Sequoia Communications uses the SiVision yield analysis application.
News from LogicVision Europe ( 4 October 2006)
GDA Technologies adopts test IP for serdes
LogicVision and GDA Technologies are to deliver design services for high speed I/O test with LogicVision's comprehensive at-speed test IP for high speed serdes circuits.
News from LogicVision Europe (27 July 2006)
Embedded tests enhance memory reliability
LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs.
News from LogicVision Europe (27 June 2006)
Memory repair analysis goes on-chip
ETMemory is a new generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes.
News from LogicVision Europe ( 6 June 2006)
Compression software tests chips at-speed
New from LogicVision, ETCompression is a deterministic test compression solution targeted at chips designed at advanced nanometre scale technology nodes.
News from LogicVision Europe (24 May 2006)
Consortium addresses standard test languages
LogicVision is participating in the Semiconductor Technology Academic Research Center on the development of test language standards.
News from LogicVision Europe (15 March 2006)
Analysis software boosts nanometre yields
LogicVision has announced the product release of SiVision 4.0, its revolutionary next-generation yield analysis automation solution.
News from LogicVision Europe ( 7 February 2006)
On-chip test boosts ASIC memory yields
Open-Silicon has adopted LogicVision's embedded memory-test and repair-analysis technology as part of the standard tool flow in its ASIC designs.
News from LogicVision Europe (14 February 2005)
Viko is ready for embedded test
Verification of interoperability
LogicVision and Magma get their act together
Corelis is ready to work with LogicVision
LogicVision adds credence to SoC testing
Embedded test technology boosts SoC throughput
LogicVision to boost reliability of MoSys 1T-SRAM
Advantest joins LogicVision Ready Partner Program
