http://www.electronicstalk.com/news/log/log000.html LogicVision Europe news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Fri, 11 Jul 2008 08:00:00 UT Fri, 11 Jul 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Platform promises most effective combination of test quality of results, ease-of-adoption and test cost reductions specifically targeted for 65 and 45nm SoC designs. Wed, 28 May 2008 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log129.html Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS. Wed, 17 Oct 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log128.html LogicVision has announced its financial results for the first quarter of 2007, ended 31st March 2007. Thu, 26 Apr 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log127.html LogicVision has signed up Noah Corporation as distributor for its products in Japan. Wed, 21 Mar 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log126.html LogicVision has appointed ISS Group to distribute its products in the UK, Norway, Poland, Finland, Ireland, Denmark and Sweden. Fri, 23 Feb 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log125.html Wintegra has selected LogicVision's leading-edge memory BIST solution, ETMemory, to help it meet its silicon manufacturing quality goals. Tue, 06 Feb 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log124.html LogicVision's ETBoundary product provides a boundary scan solution for embedded test and diagnosis of integrated circuit pin functions and board-level interconnect. Wed, 20 Dec 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log117.html LogicVision has announced the release of a new production version of the ETAccess family of products, offering integrated data-logging capabilities. Tue, 19 Dec 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log115.html Teradyne and LogicVision have established seamless interaction between LogicVision's ETAccess semiconductor diagnostic products and Teradyne UltraFlex test systems. Tue, 19 Dec 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log116.html LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs. Thu, 14 Dec 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log110.html Rapport has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products. Tue, 05 Dec 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log114.html Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data to provide detailed sub-die-level failure and performance monitoring capabilities. Tue, 24 Oct 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log112.html LogicVision has unveiled its ScanBurst tool and has partnered with Mentor Graphics to deliver a unique and improved at-speed test solution for high-speed nanometre designs. Tue, 24 Oct 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log113.html Sequoia Communications uses the SiVision yield analysis application. Wed, 04 Oct 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log111.html LogicVision and GDA Technologies are to deliver design services for high speed I/O test with LogicVision's comprehensive at-speed test IP for high speed serdes circuits. Thu, 27 Jul 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log118.html LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs. Tue, 27 Jun 2006 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log119.html