Product category:
ATE Systems
News Release from: LogicVision Europe
Edited by the Electronicstalk Editorial
Team on 19 December 2001
LogicVision to boost reliability of
MoSys 1T-SRAM
LogicVision and MoSys are collaborating to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAM family of high-density embedded memories.
LogicVision and MoSys are collaborating to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAM family of high-density embedded memories MoSys and LogicVision have already verified the integration and implementation of LogicVision's Memory BIST, and top-level test assembly technologies on MoSys 1T-SRAM embedded memories
This article was originally published on Electronicstalk on 8 Apr 2002 at 8.00am (UK)
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The embedded memory block was exercised through the LogicVision design flow using the IC Memory BIST and Chip Test Assemble products and was shown to be compatible and interoperable with the flow.
A built-in repair analysis capability has been developed which complements the compatibility activities undertaken by MoSys and LogicVision.
This capability, when deployed with MoSys 1T-SRAM embedded memory macros, provides a "built-in" means to analyse the embedded memory macro for redundancy repair purposes.
"With SoCs becoming more complex and demanding correspondingly ever larger and denser embedded memory modules, the need for integrated embedded test and analysis also becomes increasingly important", said Rodger Sykes, LogicVision's vice president of Marketing and Business Development.
"Our focus on delivering an integrated approach to SoC test and analysis underscores the importance of our collaborative initiative with industry leaders such as MoSys, with the successful 1T-SRAM highly dense embedded memory family.
The MoSys-LogicVision partnership is a significant step in both companies efforts to deliver test-efficient usable cores to the SoC marketplace".
"In addition to the proven savings delivered by the higher density and yield of 1T-SRAM memory, co-operating with leading embedded test suppliers such as LogicVision delivers additional savings to our customers", notes Mark-Eric Jones, MoSys' vice president and general manager of Intellectual Property.
"The embedded test and analysis functions provided by LogicVision combined with a built-in repair analysis capability streamline the testing and built-in analysis of the memory for redundancy repair".
The interoperability of the MoSys 1T-SRAM embedded memory cores with the LogicVision embedded test products is highlighted in a joint application note available to customers of LogicVision and MoSys products.
Availability of the full-embedded test and built-in repair analysis solution is scheduled for 4Q01.
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