LogicVision passes Sun's test

Sun Microsystems has signed a contract to deploy LogicVision's Embedded Test Solutions.

Sun Microsystems has signed a contract to deploy LogicVision's Embedded Test Solutions.

Sun will use LogicVision's embedded test throughout its IC design activities.

This will enable Sun to leverage the comprehensive test solutions from IC design to end system product.

"Our previous experience with LogicVision's Embedded Test Solutions demonstrated the usefulness of test capabilities that span our hardware development and manufacturing environment", said Sunil Joshi, vice president of Design Automation and Computer Resources for Sun Microsystems.

"LogicVision offers an integrated methodology which has potential for reducing test costs, improved resource usage, and higher degrees of test re-use".

To achieve the re-use of test that span Sun's product lifetime, Sun is using a broad set of embedded test capabilities from LogicVision's family of embedded test functions: embedded hierarchical logic test and memory test; external memory test for board and systems; and core test and chip test assembly.

"This engagement represents Sun's deployment of the concept of embedded test as an efficient means to overcome many of the test and diagnostic challenges facing the electronics industry", said Vinod Agarwal, president and CEO of LogicVision.

"We strongly feel that as system complexity increases, the benefits of embedded test will also become increasingly more apparent to other companies tasked with delivering reliable systems to the marketplace".

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