Product category:
ATE Systems
News Release from: LogicVision Europe | Subject: Advantest's T6000 series
Edited by the Electronicstalk Editorial
Team on 08 April 2002
Embedded test technology boosts SoC
throughput
LogicVision has successfully integrated its embedded test technology into Advantest's T6000 series testers to provide faster test and diagnosis of complex SoC devices.
LogicVision has successfully integrated its embedded test technology into Advantest's T6000 series testers to provide faster test and diagnosis of complex SoC devices With the growth of SoC devices containing integrated multiple functions and intellectual property cores, both companies are addressing the challenge of overall increasing costs to test these devices
This article was originally published on Electronicstalk on 14 Dec 2006 at 8.00am (UK)
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Using LogicVision's embedded test can help maximise test coverage for designs, while minimising both the pin requirements for test and the amount of time each design must sit on a tester.
With Advantest's certified T6000 series testers, users can take advantage of the LogicVision manufacturing-ready test databases (LVDB) containing all the necessary SoC embedded test information for fast diagnostics and rapid turnaround from design to manufacturing.
"The LogicVision Ready certification validates our joint commitment in providing an optimised solution for SoC test systems", said Paul Patton, director of product engineering, Advantest America.
"Our mutual customers can take advantage of LogicVision's vectorless hand-off hierarchical test capability, and interactive graphics user interface results for rapid diagnostics.
Combined with Advantest's T6000 series certified testers, we believe this will enhance product quality and speed up time to market".
"This integration allows complex chip designers and manufacturers a comprehensive test solution, and is an important step toward enabling SoC test", said Mukesh Mowji, LogicVision's vice president of marketing.
"We are pleased with the success of our joint development efforts and look forward to providing this integrated and structured implementation approach for design, debug and manufacturing to both our current and future customers".
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