Product category:
Design and Development Software
News Release from: LogicVision Europe | Subject: Yield Insight
Edited by the Electronicstalk Editorial
Team on 24 October 2006
Software adds more insight into yield
data
Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data to provide detailed sub-die-level failure and performance monitoring capabilities.
LogicVision has announced Yield Insight, a new yield learning product Yield Insight is a systematic yield learning solution that leverages detailed manufacturing test data, available from LogicVision's industry-leading embedded test products, to provide detailed sub-die-level failure and performance monitoring capabilities to help accelerate yield ramps and improve overall yields
This article was originally published on Electronicstalk on 8 Apr 2002 at 8.00am (UK)
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The shift to nanometre-scale designs in systems-on-chips (SoCs) has challenged semiconductor vendors with increasing variability in the manufacturing processes and growing design-process interactions that lead to an increasing number of yield, performance and quality issues.
These issues result in longer yield ramp-up times, unexpected yield excursions during production, and reliability issues in the end product.
Yield analysis techniques must be extended to look at sub-die-level information to study how design components are interacting with the manufacturing process to affect product yields.
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Yield Insight has been specifically created to comprehend the large volumes of available semiconductor manufacturing and test data, especially sub-die-level failure and performance information.
Yield Insight analyses this subdie data, captured across multiple die, wafers and lots, to identify systematic yield issues and to provide actionable information to the design, fab and test functions to help remedy these issues.
"Yield Insight combines LogicVision's embedded test and post-silicon diagnostics capabilities with automated yield analysis to address a critical issue for the SoC design community", said Jim Healy, President and CEO of LogicVision.
"It will enable customers to better understand the issues that lead to slower yield ramps and suboptimal yields and help remove these yield limiters".
The number of embedded memories in SoCs is growing and consuming ever larger%ages of silicon die area.
The first release of Yield Insight will specifically address memory-related yield issues by allowing LogicVision customers to leverage their investment in memory BIST intellectual property (IP).
Users will be able to analyse yield issues down to individual memories, rows, columns and bits and correlate failures to different environmental conditions.
Yield Insight will also enable users to analyse and optimise memory redundancy schemes by analysing redundancy-element utilisation, resulting in higher yields and better yield-redundancy tradeoffs.
Future releases of Yield Insight will use manufacturing test data from logic BIST and ATPG to isolate and correlate failure data down to the logic gate and net levels.
Yield Insight provides powerful graphical analysis and scripting capabilities that allow users to automate and standardise their yield analysis processes.
Users can create data-mining rules that sift through the test and yield data to automatically identify potential issues.
Yield Insight offers a structured and highly effective yield learning platform that can be used during the entire semiconductor manufacturing and test cycle, starting from silicon bring-up and characterisation, and extending into the yield ramp and volume manufacturing stages.
Availability of Yield Insight is planned for Q1 2007.
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