Product category:
ATE Systems
News Release from: LogicVision Europe | Subject: Memory BIST solutions
Edited by the Electronicstalk Editorial
Team on 05 December 2006
Embedded memory tests aid parallel
processing
Rapport has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products.
Rapport, the technology leader in low-cost dynamically configurable, massively parallel chips for compute-intensive applications at low power, has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products The Rapport Kilocore devices address the shortcomings of conventional chips by putting hundreds or thousands of high performance parallel processing elements in small, low power consumption chips
This article was originally published on Electronicstalk on 8 Apr 2002 at 8.00am (UK)
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LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs.
These chips feature the most advanced, dynamic architecture available today in working silicon and can be dynamically reconfigured in real-time for consumer electronics, mobile gaming, homeland security, server components, image processing, and suitcase supercomputing.
LogicVision's Embedded Memory Test provides a unique built-in memory test solution for this type of device.
"LogicVision's Memory BIST solution gives us the flexibility we need to effectively and efficiently test the different embedded memories in next-generation Rapport Kilocore Architecture devices", said Dr Benjamin Levine, Director of Chip Development at Rapport.
"LogicVision offers a solution that allows us to hierarchically group and test different types and sizes of memories and allows us to select the best options for testing each one".
"LogicVision also provides us with the tools to easily integrate their BIST solutions into our design flow with a minimum of effort".
"As SoC design teams incorporate more embedded memories scattered throughout their device, they demand more automation and flexibility from their memory BIST solutions", said Farhad Hayat, Vice President of Marketing at LogicVision.
"As a leader in memory BIST solutions, we provide a streamlined flow for implementing an optimum test strategy, when dealing with hundreds of memories within a single device, which helps customers such as Rapport meet their stringent manufacturing test requirements".
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