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Tundra takes quick route to IEEE1149.6

A LogicVision Europe product story
Edited by the Electronicstalk editorial team Dec 20, 2006

LogicVision's ETBoundary product provides a boundary scan solution for embedded test and diagnosis of integrated circuit pin functions and board-level interconnect.

Tundra Semiconductor Corp has successfully delivered final silicon to customers, using LogicVision's boundary scan solution to support the IEEE1149.6 standard for high-speed interconnects in its Serial RapidIO switches.

The Tundra Tsi57x family of switches, provide chip-to-chip interconnect between RapidIO end-points and can replace existing proprietary backplane fabrics for board-to-board interconnect.

"We looked at the available 1149.6 solutions in the market and only LogicVision provided the complete solution we needed", said Rick O'Connor, Chief Technology Officer at Tundra.

"Using LogicVision's solution we were able to deliver leading edge 1149.6 capability as required by our customers on time and within specifications".

LogicVision's ETBoundary product provides a boundary scan solution for embedded test and diagnosis of integrated circuit pin functions and board-level interconnect.

Access is provided through LogicVision's Test Access Port interface using the IEEE1149.1 (JTAG) and 1149.6 (ACJTAG) protocols.

The relatively new 1149.6 standard is intended for the differential and AC-coupled signals used for multigigahertz serial data.

ETBoundary automates the design, integration, verification, and production test pattern generation for boundary scan test of I/Os, even for pins that cannot be connected to test equipment because they are too fast or sensitive.

"Tundra selected our 1149.6 solution because of our leadership in defining this new standard in IEEE and being the first company to offer a complete solution to the market", said Farhad Hayat, Vice President of Marketing at LogicVision.

"Their success in implementing this solution in silicon validates the robustness of our solution and is further evidence of our leadership in delivering innovative DFT solutions for high speed I/Os".

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