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News Release from: LogicVision Europe | Subject: ETMemory
Edited by the Electronicstalk Editorial
Team on 27 June 2006
Embedded tests enhance memory
reliability
LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs.
LogicVision and Dolphin Technology have developed an integrated and comprehensive self-testable and self-repairable memory solution for advanced nanometre designs The integrated solution consists of Dolphin's high performance 90 and 65nm memories and LogicVision's recently announced ETMemory solutions
This article was originally published on Electronicstalk on 6 Jun 2006 at 8.00am (UK)
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ETMemory is a new generation of embedded memory test and yield capabilities specifically targeted at chips designed at advanced technology nodes.
To achieve this advanced solution, enhancements were made to both Dolphin's RAMpiler and RAMpiler+ memory compilers and to LogicVision's LV2005 automation tools to provide a completely seamless and fully automated embedded test and repair integration flow.
The companies are also closely co-operating to ensure that Dolphin memories are provided the highest quality of test possible and the most optimal automated repair scheme.
"A successful memory strategy today requires not only the right memories, but the right test and repair capabilities as well", said Mo Tamjidi, President of Dolphin.
"The combination of our memories with LogicVision's embedded test technology results in a best in class solution in the repairable embedded memory space, enabling our customers to reduce their time to market while maximising yield".
"Dolphin memories are used by many of our customers", said Jim Healy, President and CEO of LogicVision.
"This integration effort will ensure that these customers can easily achieve the industry leading quality and yield benefits provided by our solutions".
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