Distributor appointment expands Japanese support
LogicVision has signed up Noah Corporation as distributor for its products in Japan.
LogicVision has signed up Noah Corporation as distributor for its products in Japan.
Noah is a provider of semiconductor analysis and test equipment to the Japanese semiconductor companies, and complements LogicVision's existing sales and field operations in Japan to better serve customers and grow LogicVision's business in Japan.
"Noah has well established relationships with leading semiconductor and system companies in Japan", said Jim Healy, CEO of LogicVision.
"As these companies move to lower process geometries, Noah will enable us to accelerate the adoption of our tools and IP as well as provide our customers with training and support".
The demand for advanced DFT solutions is increasing in order to contain manufacturing test costs and improve final product quality with nanometre SoC designs.
LogicVision provides a comprehensive family of manufacturing test solutions that is helping leading semiconductor companies meet the growing test challenges.
"We're excited to expand our product offering with the addition of LogicVision solutions", said Hiroshi Tabira, CEO of Noah.
"We have strong business relationship with manufacturing test groups within the semiconductor companies and the addition of LogicVision's DFT and silicon diagnostic products will allow us to offer a more complete solution to help semiconductor companies deal with rising manufacturing test challenges".
Under the agreement, Noah will sell the complete line of LogicVision test solutions to the Japan semiconductor design community.
Noah's head office is based in Shibuya, Tokyo, Japan.
Not what you're looking for? Search the site.
Categories
- Active Components (11,917)
- Passive Components (2,949)
- Design and Development (9,394)
- Enclosures and Panel Products (3,246)
- Interconnection (2,841)
- Electronics Manufacturing, Production, Packaging (3,055)
- Industry News (1,898)
- Optoelectronics (1,616)
- Power Supplies (2,297)
- Subassemblies (4,551)
- Test and Measurement (4,956)
