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Metryx

Address:
Unit 2 Manor Park
Nailsea Wall Lane, Nailsea
Bristol
BS48 4DD
UK
Telephone: (UK) +44 127 586 6260

http://www.metryx.net

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Listing of all 9 news releases from Metryx:

Directors accelerate global business development

Mark Berry has been appointed North America and Europe Business Director, and Gary Ditmer has joined Metryx as Asia Business Director.

News from Metryx (13 April 2007)

Mass metrology proves popular with chip makers

Metryx has received orders from three new customers for its innovative mass metrology Mentor technology.

News from Metryx (16 October 2006)

Peace comes to advisory board

Elton Peace is joining its Advisory Board of Directors at Metryx.

News from Metryx ( 6 March 2006)

Cunnane adds semiconductor processing experience

Nanotechnology weight metrology specialist Metryx has appointed Liam Cunnane as Technology Director for North America.

News from Metryx ( 8 February 2006)

Wafer metrology tool offers atomic layer accuracy

A new nondestructive nanotechnology weight metrology tool handles high-volume production of 300mm semiconductor wafers.

News from Metryx (11 January 2006)

Weight metrology tool keeps wafers honest

A novel nanotechnology weight metrology tool offers atomic layer measurement accuracy and is designed to handle the demands of volume production environments.

News from Metryx (15 December 2005)

Weight metrology proves popular in wafer fabs

Metryx has won orders worth up to $4 million for its revolutionary Mentor high-throughput simple-to-use nondestructive metrology tool that offers atomic layer measurement accuracy.

News from Metryx (29 September 2005)

Weight metrology aids thin-film research

A manual, benchtop nondestructive R and D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx.

News from Metryx ( 9 September 2005)

Metrology tool checks wafer processing steps

A high-throughput, simple-to-use, nondestructive metrology tool that offers atomic layer measurement accuracy has been developed by Metryx of Bristol, UK.

News from Metryx (26 July 2005)

 

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