http://www.electronicstalk.com/news/mef/mef000.html Metryx news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Mon, 14 Jul 2008 08:00:00 UT Mon, 14 Jul 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Mark Berry has been appointed North America and Europe Business Director, and Gary Ditmer has joined Metryx as Asia Business Director. Fri, 13 Apr 2007 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef108.html Metryx has received orders from three new customers for its innovative mass metrology Mentor technology. Mon, 16 Oct 2006 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef107.html Elton Peace is joining its Advisory Board of Directors at Metryx. Mon, 06 Mar 2006 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef106.html Nanotechnology weight metrology specialist Metryx has appointed Liam Cunnane as Technology Director for North America. Wed, 08 Feb 2006 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef105.html A new nondestructive nanotechnology weight metrology tool handles high-volume production of 300mm semiconductor wafers. Wed, 11 Jan 2006 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef104.html A novel nanotechnology weight metrology tool offers atomic layer measurement accuracy and is designed to handle the demands of volume production environments. Thu, 15 Dec 2005 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef103.html Metryx has won orders worth up to $4 million for its revolutionary Mentor high-throughput simple-to-use nondestructive metrology tool that offers atomic layer measurement accuracy. Thu, 29 Sep 2005 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef102.html A manual, benchtop nondestructive R and D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx. Fri, 09 Sep 2005 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef101.html A high-throughput, simple-to-use, nondestructive metrology tool that offers atomic layer measurement accuracy has been developed by Metryx of Bristol, UK. Tue, 26 Jul 2005 08:00:00 UT Metryx http://www.electronicstalk.com/news/mef/mef100.html