Product category:
Design and Development Software
News Release from: Mentor Graphics UK
Edited by the Electronicstalk Editorial
Team on 07 October 2004
Koenemann brings DFT expertise
Noted test industry expert, Dr Bernd Koenemann, has joined the Mentor Graphics Design-for-Test (DFT) product division as a Chief Scientist.
Noted test industry expert, Dr Bernd Koenemann, has joined the Mentor Graphics Design-for-Test (DFT) product division as a Chief Scientist As a member of Mentor's DFT Advanced Research Group, Dr Koenemann will contribute to developing new test solutions that address growing design complexity and quality needs
This article was originally published on Electronicstalk on 21 Feb 2001 at 8.00am (UK)
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"I am delighted to be part of an exceptional innovative team", said Dr Koenemann.
"Mentor has an outstanding track record for pioneering high-quality DFT technologies and I am excited to bring my experience and expertise to the team".
Dr Koenemann joins Mentor Graphics from Cadence Design Systems.
His experience includes key engineering, management and executive positions at Cadence, LogicVision, IBM and Honeywell.
He holds several patents in the field of test technology.
Dr Koenemann joins an established team of test industry experts, including Dr Janusz Rajski and Dr Wu-Tung Cheng.
"We are very excited to have Dr Koenemann join the distinguished team of test industry luminaries in our Design-for-Test group", said Robert Hum, Vice President and General Manager, Design Verification and Test Division, Mentor Graphics.
"He will clearly add to the innovation this team continues to deliver in our DFT solutions targeting nanometre design issues".
Dr Koenemann will deliver the keynote address at the International Test Conference (ITC) on 26th October 2004 in Charlotte, North Carolina.
In his speech, "Test in the era of 'what you see is not what you get'", Dr Koenemann will discuss how increasing design complexities threaten design closure predictability as well as its effect on yield.
It will also focus on how manufacturing test can evolve as a contributor to continuous design-process characterisation.
This marks the second consecutive year Mentor Graphics has presented during the ITC plenary session.
Last year, Dr Rajski delivered the invited address titled "Test challenges of nanometre design".
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