Product category:
Design and Development Software
News Release from: Mentor Graphics UK | Subject: FastScan and TestKompress
Edited by the Electronicstalk Editorial
Team on 08 October 2004
Software automates test generation
Mentor Graphics has added new automated functionality to its FastScan automatic test pattern generation tool and its TestKompress embedded deterministic test tool.
Mentor Graphics has added new automated functionality to its FastScan automatic test pattern generation tool and its TestKompress embedded deterministic test tool The ATPG Expert feature automatically analyses the design and manages all the complexities of test pattern generation to achieve optimal results in terms of test coverage, pattern count and run times
This article was originally published on Electronicstalk on 21 Feb 2001 at 8.00am (UK)
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As design processes move to nanometre geometries, selecting the most effective ATPG parameters to achieve desired results can be a daunting task.
The ATPG Expert feature works as an internal "expert" within the FastScan or TestKompress tools to automatically analyse the design and make the decisions needed to produce the best results.
It manages test generation complexities, such as how to deal with RAM shadow logic, and determines the sequential depth or abort limits to set, the types of compression to exploit, and how to handle clock interactions and bus contention.
The result is higher coverage, minimal pattern count and optimised run times.
"The move to nanometre design brings with it a number of new complexities and uncertainties".
"By automating more of the ATPG process, our goal is to add certainty and to simplify the process of achieving optimal test results", said Robert Hum, Vice President and General Manager, Design Verification and Test Division, Mentor Graphics.
"We incorporate the same functionality available in the FastScan tool into the TestKompress tool so customers can easily adopt and integrate these tools into their design flow for comprehensive and scalable test solution".
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