Product category:
Intellectual Property Cores
News Release from: MoSys
Edited by the Electronicstalk Editorial
Team on 26 July 2001
Partners support proliferation of
1T-SRAM
MoSys has disclosed the 14 charter members of the MoSys 1T-SRAM Design Services Alliance (DSA).
MoSys has disclosed the 14 charter members of the MoSys 1T-SRAM Design Services Alliance (DSA) DSA members provide customers with additional expertise to accelerate design cycles and ramp to volume production
This article was originally published on Electronicstalk on 21 Aug 2001 at 8.00am (UK)
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Off-the-shelf macros put 1T-SRAM on SoC menu
MoSys has made available a family of standard 1T-SRAM memory macros using silicon-proven 0.25- and 0.18-micron cores.
36Mbit SRAM is optimised for 100% bus usage
MoSys is shipping its high-density, low-power 36Mbit memory, making it the first to market with this level of bit density.
This initiative supports the proliferation of 1T-SRAM memory to an increasing number of SoC designs.
"Building on our customers' production success with 1T-SRAM technology, the wealth of experience of our DSA partners will expand global access to this technology", commented Bill Lev, manager of MoSys' DSA program.
"We are pleased by the strong response received from industry leaders and excited by the benefits our customers will realize from this infrastructure".
The DSA comprises members in three important areas: turnkey design, design for test, and assembly and test.
Charter turnkey design services members spanning the globe are Arcadia Design Systems, EE Solutions, eSilicon, Goya Technology, MacroTech, Nordic VLSI, QThink, SOTA Design Technology, Spinnaker Systems, Toppan and TSMC Design Services.
These members provide MoSys' 1T-SRAM customers additional expertise for SoC product development including netlist-to-tapeout, product engineering and production management.
The design for test charter members - LogicVision and Mentor Graphics - are providing integrated design-for-test (DFT) and built-in-self-test (BIST) solutions for 1T-SRAM users.
In addition, charter assembly and test member ASE Test provides wafer sort, laser repair and assembly of ICs incorporating 1T-SRAM macros.
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