Latest news on Electronicstalk categorised by supplier
National Instruments
Address:
Measurement House Newbury Business Park
London Road
RG14 2PS
UK
Telephone: (UK) +44 1635 523545
http://www.ni.com/uk
Our RSS feed for news from National Instruments
Request to receive our free email newsletter each week
Listing of all 270 news releases from National Instruments:
Keynote address tackles military applications
Colonel Ransom will review the relationship between the MOD and its suppliers and outline its effect on upcoming programmes such as the Digital Diagnostic and Repair (DDR) facility. Brochure available
News from National Instruments (13 May 2008)
Software eases model comparisons
Engineers and scientists can also use National Instruments' toolkit to easily create user interfaces to interact with their models built using Simulink. Brochure available
News from National Instruments (12 May 2008)
USB acquisition devices sample faster
Light and compact devices deliver high-performance I/O for portable USB applications such as field measurements and laptop-based data acquisition. Brochure available
News from National Instruments ( 8 May 2008)
Portable touchscreen makes mobile ATE
Accessory is ideal for a variety of portable PXI applications, such as in-vehicle test, mobile diagnostics and personal ATE in the automotive, ATE and aerospace and defence industries. Brochure available
News from National Instruments ( 5 May 2008)
PXI modules feature FPGA flexibility
Hardware can be graphically programmed with the NI LabView FPGA Module to perform custom onboard processing for inline data analysis and deterministic I/O control. Brochure available
News from National Instruments ( 2 May 2008)
Automated test summit to have global coverage
The Automated Test Summit 2008 will be hosted live online on 5th June 2008, and will be presented in the Americas, Europe and Asia. Brochure available
News from National Instruments (30 April 2008)
PC software supports the latest Tek scopes
New software release can be used to control the Tektronix DPO3000 and TDS3000C digital phosphor oscilloscopes as well as the MSO4000 mixed-signal oscilloscopes. Brochure available
News from National Instruments (28 April 2008)
Controllers put PXI into embedded sector
PXI controllers allow designers to create PC-based platforms that offer an optimal balance of performance and value. Brochure available
News from National Instruments (24 April 2008)
Graphical design accelerates ARM development
Embedded applications created in LabView can now be deployed on a range of more than 260 ARM-based microcontrollers manufactured by the world's leading semiconductor companies. Brochure available
News from National Instruments (17 April 2008)
High-reliability digital I/O moves out to USB
With 96 bidirectional digital I/O channels and plug-and-play USB connectivity, the device is ideal for industrial control and automated test applications. Brochure available
News from National Instruments (10 April 2008)
Learn how to program multicore processors
Intel-sponsored workshops to be held around the globe take a hands-on approach to multicore programming. Brochure available
News from National Instruments ( 9 April 2008)
USB acquisition devices boost resolution
The onboard 18bit ADC provides a 4x increase in resolution over traditional 16bit devices, equivalent to more than 5.5 digits of resolution for DC measurements. Brochure available
News from National Instruments (20 March 2008)
Controller keeps VXI systems at a distance
Remote controller enables test engineers to use general-purpose desktop and laptop computers to control VXI chassis across a thin, flexible cable that extends up to 7m. Brochure available
News from National Instruments ( 6 March 2008)
SMU and switches expand PXI appeal
Products further enhance the PXI platform for use in precision DC applications, such as semiconductor parametric tests and electronic device and component validation. Brochure available
News from National Instruments (14 February 2008)
Digitisers and DMM expand USB modules
Compact lightweight instruments are ideal for portable, benchtop and OEM applications. Brochure available
News from National Instruments ( 8 February 2008)
Test management software drives compliance
User application article Open, flexible development platform eases implementation of the TekExpress compliance test automation framework for Serial ATA and other complex serial data standards. Brochure available
News from National Instruments ( 7 February 2008)
Multicore organisation improves interoperability
National Instruments is collaborating with technology companies including Intel, Freescale Semiconductor and Wind River to improve the interoperability among operating systems. Brochure available
News from National Instruments ( 1 February 2008)
Seminar tour offers hands-on acquisition training
Delegates will test-drive professional PC-based data acquisition systems and learn how to create modular, flexible and scalable systems with short development times at low cost. Brochure available
News from National Instruments (24 January 2008)
Test technologies keep up with design complexity
Technical background article Eric Starkloff highlights five trends he expects will significantly influence the test and measurement industry over the next three years. Brochure available
News from National Instruments (16 January 2008)
Military and aerospace testing in the spotlight
Conference and exhibition features technical demonstrations and case studies from the military and aerospace test arena. Brochure available
News from National Instruments (14 January 2008)
Small power meter covers a large range
Addon board aids telecomms education
Development environment expands multicore support
National Instruments joins Power.org
IP library gets the measure of FPGA design
Bundle gets to grips with acquisition design
Controllers provide large, sustainable bandwidth
Software helps students design robot
Software simplifies data analysis
USB acquisition devices extend to 80 channels
Embedded programming is made for DSP
Graphical programming turns to multicore design
PXI instruments provide express transfers
Testing readies space telescope for launch
Conference to focuses on automotive development
Low-cost DMM brings 6.5-digit resolution to PXI
DAQ devices enable intelligent medical design
Software-defined systems dominate conference
Alliance targets manufacturing test sector
Express performance comes to PXI instruments
Software upgrade eases test system deployment
NI grows income in a tough quarter
Annual Automated Test Summit comes online
Academic design software has more scope
Software analyses instrument data in real time
Programming environment includes new OS
High reliability controller uses VxWorks RTOS
Embedded module expands support
Radio tester for terrestrial and satellite testing
PCI instruments optimise cost and performance
Conference is devoted to military and aerospace
Triple the I/O options for modular data logger
Spice simulation and circuit analysis upgraded
Software simplifies common measurement tasks
Eight new Vice Presidents for test specialist
Switching modules make RF testing more flexible
Module aids real-time measurement setups
Embedded controllers accelerate PXI testers
Virtual instruments drive NI to record quarter
USB acquisition system is one of the best
USB modules acquire from CAN and LIN
More options in USB-based data acquisition
National Instruments extends LabView
Second quarter results for National Semiconductor
National Instruments compatible with Vista
Studio 8.1 simplifies remote monitoring
New network variables simplify communication
Upgrade for digital filter design toolkit
Pioneer programmes enable technology preview
Acquisition boards make the most of PCI Express
Platform is proving ground for real-time control
Frame grabbers cover major digital camera buses
Drivers aid wireless development
Asian expansion drives record quarter
Algorithm development standard is updated
Roadshow demonstrates Blackfin programming
Alliance partner expands operations
Alliance aims for PXI expansion to RF testing
Annual conference set for Savoy Place
Ranking recognises graduate development
Module offers acquisition link to CAN
Software puts new Tek scopes in the system
RF vector signal analyser runs on PXI
Alliance aims for instrument integration
DAQ devices are isolated for safer systems
Chassis cuts the cost of PXI instrumentation
DAQ modules and controllers ride PCI Express bus
Digitiser/oscilloscope extends to 2Gsample/s
Graphical programming targets Lego market
Graphical dataflow eases embedded design
Graphical programming aids telecomms design
Strong balance sheet maintained at NI
New PXI-5105 eight-channel digitiser
Kamen to deliver closing keynote
PXI switch module for battery/fuel cell test
Acquisition range moves to voluntary compliance
Military and aerospace testing at Twickers
Prototyping teaching suite switches to USB
Snelling and Saxon make the grade
Dual-core processor boosts PXI performance
Network tops 5000 instrument drivers
It's official: NI is a great place to work
Student software bundles powerful addons
USB acquisition devices boast top performance
Webcasts to extol graphical system design
Modular acquisition system runs up to 256 channels
Revenues continue to rise at NI
RF switch boards speed automatic test setups
Measurement software presents results online
Speedy digitiser adopts PCI form factor
Express signalling accelerates PXI bandwidth
Alliance welcomes NI's help with ZigBee roll-out
Graphical programming extends to Blackfin
Gokhale takes charge in the UK and Ireland
Graphical development turns to complex control
Acquisition module takes industrial sensor signals
Programmable supply is powerful PXI instrument
Prize winner forwards grant to Ankara University
Automated Test Summit comes to the UK
Flexible digitiser is voted best of the year
PC software helps make more of new Tek scopes
Software is instrumental in saving DSP power
Milestones loom for NI and its key product
Manchester postgrad is top MSc student
NI posts record quarterly revenue
Horn follows career path at National
Analysis software mines for meaningful data
Flexible-resolution PXI digitiser is a winner
Programming environment brings robots to life
Electronics Workbench announces Multisim 9
Instrument drivers switch to Linux systems
Interface speeds I2C and SPI development
Rawlings joins elite band of test engineers
Panels front up PXI instrument systems
PXI instruments build Typhoon cable tester
Modular instruments make light of medical tests
CameraLink acquisition runs at express rates
Development environment compiles C faster
VI technologies on show at Productronica 2005
Instrument sales drive record quarter for NI
Interface toolkit links design with test
Modular instruments put latest Xbox on trial
Laptop computers take charge of GPIB
DAQ drivers upgrade for latest software
Latest LabView adds distributed intelligence
TBG Solutions' director receives NI certification
NI goes green despite RoHS exemption
PCIbus acquisition devices boast speedy sampling
PXI chassis adds low-cost remote control
Standard interfaces put laptops in control of PXI
PCI Express speeds measurement control
Multifunction acquisition comes to PCI Express
Graphical development targets Blackfin processors
Software speeds convertor evaluation
Toolkit supports automotive development
Toolkit adds signal processing to test setups
Acquisition board synchronises multiple cameras
PXI controller boasts top real-time performance
Acquisition platform adds CAN interface
High-performance acquisition runs over USB 2.0
Upgraded FPGAs boost acquisition modules
Measurement systems cover multiple RF standards
Graphical environment extends to embedded design
Data acquisition family extends to 80 channels
Military and aerospace solutions in Hendon
System-level alternative for DSP programming
Driver software aids DAQ development
PXI controllers promise express delivery
GPIB controller goes faster over USB
Custom testers speed automotive systems to market
CompactFlash card turns PDAs to acquisition
Digitiser revolutionises dynamic measurements
Generators accelerate comms systems design
Acquisition software boosts digital I/O capability
Controllers triple processing performance
Top accuracy claims for PXI-based DMM
Speedy route to digital filter design
Waveform generator/analysers test LVDS on PXI
System aids analysis of missile defences
NI acquires Electronics Workbench
Toolkit turns LabView to Blackfin development
NI posts new record income for Q4
NI puts patent settlement to good use
Instrument driver network tops 4000 devices
USB devices cut the cost of acquisition
Graphical development environment is top product
Read all about virtual instrumentation
Kit helps create custom I/O modules
Free trial for graphical development online
Low cost strain modules ideal for structural test
Students spoilt with virtual instrumentation
Board brings image acquisition to mainstream PCs
Driver aids Linux-based acquisition
GPIB controller speeds onto PCI Express
Platform embeds LabView-based acquisition
Digitisers run up to 200Msample/s
Data acquisition for a new generation
Measurement software aids design verification
Software speeds test development in C
Software streamlines switch system development
PXI module offers three instruments in one
Software simplifies test system development
Magazine readers praise NI website
Speedy setup for USB-based acquisition hardware
Analysers offer flexible digital interfacing
Top performance from PXI embedded controller
PXI acquisition module takes Camera Link input
PXI module offers highest-density switching
Hungarian plant is top spot for employment
Digital I/O family delivers industrial features
Upgrade for model-based control system design
Automation speeds instrumentation development
PXI switching modules cram in more relays
24bit I/O card is sound acquisition
Services software supports real-time acquisition
Addon eases test report generation
CD speeds test system specification
Vector signal generator aids RF characterisation
Virtual instrumentation roadshow hits the UK
Modular instrument family aids mixed-signal test
Step-by-step data acquisition seminar
Software makes more sense of test data
Price cuts for popular data acquisition modules
Measurement and automation catalogue goes online
Switching modules offer faster ATE systems
Chassis simplifies PXI system design
Software tools speed comms testing
CAN hardware speeds automotive testing
Staffordshire hosts electronic design centre
Measurement tools come up to date
Upgrade is most significant yet
Speedy samplers aid mixed-signal testing
Software speeds ATE development
Seminars extol virtues of LabView 7
It's still fun to work for National Instruments
Boost for CAN data acquisition
Measurement and automation online and in print
Training on computer-based instrumentation
Module produces speedy 16bit PXI analogue output
PXI board upgrades vision acquisition
Modules take 12bit themocouple data
August date for virtual instrumentation conference
System puts flat panel displays to the test
Portable acquisition on FireWire
Software simplifies motion control development
Real-time PXI controllers speed system response
Latest drivers simplify system building
Learn all about it: measurement classes go online
RTD modules offer low-channel monitoring options
Motion control joins acquisition software
Digitiser jumps aboard the PCIbus
Controller cards drive test platforms
Now you can run CAN in LabVIEW
More functionality added to measurement software
Interface puts VXI and PCI together
More measurement options from real-time software
Toolset simplifies database connectivity
Modules condition a range of sensor signals
Low-cost data acquisition card runs from a laptop
High-precision audio and vibration measurements
