Product category:
Board-Level Instruments
News Release from: National Instruments
Edited by the Electronicstalk Editorial
Team on 27 February 2006
Automated Test Summit comes to the UK
The Automated Test Summit is a free one-day conference and exhibition taking place at Edgbaston Cricket Ground, Birmingham, UK on Tuesday 28th March 2006.
National Instruments will host the Automated Test Summit 2006, a free one-day conference and exhibition taking place at Edgbaston Cricket Ground, Birmingham, UK on Tuesday 28th March 2006 At this industry event, other leading industry players will join with NI to help delegates learn about emerging trends and techniques in design validation and manufacturing test and see the latest automated test innovations in action
This article was originally published on Electronicstalk on 22 Aug 2008 at 8.00am (UK)
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"Over the past two years, the Automated Test Summit in the USA has provided more than a thousand automated test engineers and managers with the opportunity to discuss strategies for optimising test throughput and improving overall quality while minimising cycle times", said Ian Bell, National Instruments UK and Ireland Technical Marketing Manager.
"Based on overwhelmingly positive feedback, we are hosting the Automated Test Summit 2006 in the UK with new technical content, partners and case study presentations that reflect the current issues the industry faces".
The Automated Test Summit 2006 offers delegates the opportunity to learn how leading corporations increase return on investment through improved automated test methods.
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Representatives from companies including National Instruments, Tektronix, Virginia Panel, Dowding and Mills, JTAG Technologies, AmFax, Cyth Systems and Electronics Workbench share their expertise on ensuring product quality, choosing platforms for test and improving test throughput with modular software and hardware.
Keynote presentations, technical sessions and case studies address new technologies such as PCI Express, synchronisation and calibration strategies, software autoscheduling and selecting the appropriate bus technology (LAN, USB, GPIB, PCI/PXI) for any system.
Technical session topics include: trends and techniques across the development cycle; bridging validation and test with common software technology; incorporating best practices for ensuring product quality; evaluating platforms for performance and reusability; and improving test throughput with emerging technologies.
"Engineers are faced with increased pressures to improve design and manufacturing processes, lower development costs and shorten time to market", said Bell.
"The Automated Test Summit will provide our delegates with tools and tips to increase measurement productivity, helping them overcome the market pressures they face".
"This is one of the only events at which automated test and validation engineers can meet with key players in the industry at one time".
Interested parties can register through the National Instruments website. Request free introductory details about products from National Instruments ...
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