Measuring system aids Welsh startups
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Nikon UK product story
Edited by the Electronicstalk editorial team
Sep 20, 2005
Technology startups at one of Wales' flagship Technium incubation centres have received a major boost with the installation of a high performance Nikon Nexiv Z120X video measuring system.
Technology startups at one of Wales' flagship Technium incubation centres have received a major boost with the installation of a high performance Nikon Nexiv Z120X video measuring system.
The Nexiv will help occupants of the Technium Optoelectronics Technology and Incubation Centre in North Wales develop innovative platform technologies in the areas including: optoelectronics; surface structuring; thin films; lab-on-a-chip devices; and optical packaging.
Equipped with some of Nikon's most advanced optical accessories, including the Nikon D-Surf surface analysis software, which makes it the first of its kind in the UK.
The Nexiv will be made available to both incubation clients and external companies in market sectors including; aerospace, optics and photonics, medical, semiconductor, automotive and sectors that have requirements for advances measurement and surface analysis techniques.
According to Ian Maxwell, Marketing Manager at the centre: "The Nexiv has been commissioned to give companies access to super high magnification, and high performance noncontact measurement capabilities".
"This will assist in the development and refinement of both existing and emerging technologies".
Located in the Metrology Centre, the Nexiv Z120X is a special version of the popular Nexiv system that can identify and measure even the smallest features on miniaturised electronic components and assemblies.
Its innovative use of twin objectives allows the low power zoom lens to be used to locate the sample, while the higher magnification lens, operating at up to 4320x optical magnification, is used for extremely precise measurements.
The U2xy accuracy is guaranteed up to 1.2+2.5L/1000um.
Nikon has also supplied the centre with an ME600L episcopic/diascopic illumination-type microscope for manual sample inspection and analysis.
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