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News Release from: National Physical Laboratory
Edited by the Electronicstalk Editorial
Team on 21 December 2005
National Physical Laboratory researchers
honoured
Three National Physical Laboratory (NPL) researchers - Dr Chris Hunt, Alan Brewin and Ling Zou - have been honoured for their contribution to the development of IPC-9691.
Three National Physical Laboratory researchers earned accolades -- Dr Chris Hunt, Alan Brewin and Ling Zou Hunt proudly collected the Distinguished Committee Services award that recognised NPL's contribution to the development of IPC-9691, User Guide for the IPC-TM-650, Method 2.6.25, Conductive Anodic Filament (CAF), Resistance Test (Electrochemical Migration Testing)
This article was originally published on Electronicstalk on 2 Jan 2008 at 8.00am (UK)
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CAF is a sub-surface failure mode for woven glass-reinforced laminate (FR4) materials, in which a copper salt filament grows and results in a consequential electrical short between plated through-hole (PTH) walls or adjacent copper planes.
In this study FR4 laminates, in the form of high PTH density multi-layer test circuits, were exposed to different manufacturing conditions and studied for resistance to CAF initiation and growth.
CAF performance was assessed using high temperature and humidity conditions to promote failures.
By application of a range of voltages and via geometries the basis for a performance map for laminates was obtained for use in materials comparison.
The changes due to exposure of laminates to lead-free temperatures and other processing steps were then examined using the technique, and a number of important recommendations were made regarding minimising the possibility of CAF initiation and growth.
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