Product category:
Stand-Alone Instruments
News Release from: Olympus Life Science Europa | Subject: NIR for BX51
Edited by the Electronicstalk Editorial
Team on 10 July 2001
Inrfa-red scope aids chip package
inspection
A new system for infra-red observation has been developed by Olympus for use with the Olympus BX51 metallurgical microscope.
A new system for infra-red observation has been developed by Olympus for use with the Olympus BX51 metallurgical microscope Near-infra-red light observations are a valuable method of studying semiconductor interiors and the back surface of a chip package, as well as CSP bump inspections
This article was originally published on Electronicstalk on 11 Oct 2006 at 8.00am (UK)
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Digital camera for microscopy offers a smooth, easy-to-view live display of high-resolution images at 15 frames per second and stand-alone operation.
For use with the BX51M materials microscope from Olympus, a selection of objectives has been specifically designed to compensate for optical aberrations from visible wavelengths right through to the NIR range.
Six objectives are available to cover the range from 5x to 100x magnification.
100W mercury illumination is provided.
Both a trinocular tube, and a single-port tube with lens for direct video capture of IR images, are available.
In addition the system includes specialised bandpath and neutral density filters, polariser slider, and a rotatable analyser slider, all optimised for IR operation.
Adjustment of the microscope arm height allows samples over 65mm in height to be placed on the stage and examined. Request a free brochure from Olympus Life Science Europa ...
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