Product category:
Stand-Alone Instruments
News Release from: Olympus Life Science Europa | Subject: BX51
Edited by the Electronicstalk Editorial
Team on 22 November 2001
Infra-red scope checks semiconductor
materials
A new system for infra-red observation has been developed by Olympus for use with the BX51 metallurgical microscope.
A new system for infra-red observation has been developed by Olympus for use with the BX51 metallurgical microscope Near-infra-red light observations are a valuable method of studying semiconductor interiors and the back surface of a chip package, as well as CSP bump inspections
This article was originally published on Electronicstalk on 10 Jul 2001 at 8.00am (UK)
Related stories
Inrfa-red scope aids chip package inspection
A new system for infra-red observation has been developed by Olympus for use with the Olympus BX51 metallurgical microscope.
For use with the BX51M materials microscope from Olympus, a selection of objectives has been specifically designed to compensate for optical aberrations from visible wavelengths right through to the near-infra-red range.
Six objectives are available to cover the range from 5x to 100x magnification.
100W mercury illumination is provided.
Both a trinocular tube, and a single port tube with lens for direct video capture of IR images, are available.
In addition the system includes specialised band pass and neutral density filters, polariser slider, and a rotatable analyser slider, all optimised for IR operation.
Adjustment of the microscope arm height allows samples over 65mm in height to be placed on the stage and examined. Request a free brochure from Olympus Life Science Europa ...
• Olympus Life Science Europa: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
