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    <copyright>Copyright (C)2008 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Mon, 25 Aug 2008 08:00:00 UT</pubDate>
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      <title>XRF analyser needs only a small sample</title>
      <description>With its high-resolution detector, the X-Strata980 makes it easier to identify, quantify and differentiate neighbouring elements.</description>
      <pubDate>Tue, 05 Feb 2008 08:00:00 UT</pubDate>
      <category>Oxford Instruments Industrial Analysis</category>
      <link>http://www.electronicstalk.com/news/oxd/oxd101.html</link>
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      <title>Novel approach to PCB coating measurements</title>
      <description>Innovative system measures organic solderablity preservative thickness in PCB manufacturing operations.</description>
      <pubDate>Mon, 19 Mar 2007 08:00:00 UT</pubDate>
      <category>Oxford Instruments Industrial Analysis</category>
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