Visit the IEEE ESTC-2008 Conference and Exhibition web site
Click on the advert above to visit the company web site

Product category: Electronics Manufacturing Quality Assurance
News Release from: Oxford Instruments Industrial Analysis | Subject: X-Strata980
Edited by the Electronicstalk Editorial Team on 05 February 2008

XRF analyser needs only a small sample

Request your FREE weekly copy of the Electronicstalk email newsletter. News about Electronics Manufacturing Quality Assurance and more every issue. Click here for details.

With its high-resolution detector, the X-Strata980 makes it easier to identify, quantify and differentiate neighbouring elements.

New from Oxford Instruments, the X-Strata980 X-ray fluorescence analyser combines a high-power X-ray tube and large LN2 free detector, to measure small areas of complex samples and deliver limits of detection in single-digit parts per million Detecting hazardous elements in small amounts assures the production of environmentally friendly products and saves business from costly recalls or enforcement of regulatory legislation

The instrument performs excellent analysis and characterisation of multilayer coatings, SAC alloys, uPPF and solar panels.

Other key applications for this instrument include coating thickness measurement of gold and palladium on electronics, metal alloy chemistry identification, and coating thickness measurement on jewelry.

With a high resolution detector, the X-Strata980 makes it easier to identify, quantify and differentiate neighbouring elements.

The large detector size increases the count rate, so that most analysis can be done in seconds to minutes.

Choose the best of five primary filters to selectively excite a particular element of interest and get optimum application performance.

Features can be measured as small as 150um in size.

Collimators are available in a variety of sizes.

Because users don't always know the matrix or range of elements to be analysed, the X-Strata980 offers the freedom to choose the best calibration method for a specific application - either empirical or fundamental parameter calibration or a combination of both.

When the matrix and range is known, the empirical calibration method will give the best accuracy for alloy identification and chemical composition.

But when matrix matches and standards are not readily available, then the fundamental parameter technique with full spectrum database provides reliable quantitative analysis covering a wide range of concentrations and thicknesses for complex coatings and substrates.

A large area can be qualitatively analysed in one measurement cycle using the X-Strata980's mapping function.

Once problem areas are identified, the operator can return to specific spots with pinpoint accuracy and execute quantitative analysis.

With the analyser's embedded camera and live video imaging, precise sample placement is assured.

Generate an image of the entire sample with the concentration or intensity of an element superimposed with a false colour map.

Produce composite maps that display the combined intensity or concentration of multiple elements.

The X-Strata980 offers complete statistical data functions and a user programmable display for colour coded pass/fail warnings for elements of interest.

Detailed reports are available to show due-diligence when testing for hazardous elements in consumer goods.

Shortcut keys allow the user to choose proper calibrations.

Oxford Instruments Industrial Analysis: contact details and other news
Email this article to a colleague
Register for the free Electronicstalk email newsletter
Electronicstalk Home Page

Search the Pro-Talk network of sites

Visit the IEEE ESTC-2008 Conference and Exhibition web site