Product category:
Test Accessories
News Release from: Peak Test Services | Subject: P945-D
Edited by the Electronicstalk Editorial
Team on 11 November 2002
Ball-contact probes withstand lateral
stresses
A new type of spring-contact test probe replaces the conventional contact surface based on a moving head and plunger construction with a spring-loaded ball.
Peak Test Services has a new type of spring-contact test probe that replaces the conventional contact surface based on a moving head and plunger construction with a spring-loaded ball The new design of the P945-D gives a very low spring travel of only 0.4mm, and results in a very compact assembly for ease of installation
The new probe is ideally suited to applications where lateral stresses are likely to be encountered, including tests on reading heads or slip rings.
The total length of the probe, including connector pins, is only 11mm, and it can be used in a number of different soldering or PCB mounting configurations.
Minimum separation for mounting is 3mm between centres, and spring force is 1.5N at 0.4mm working travel.
The P945-D probe is available directly from Peak Test Services in the UK and Ireland, and from a network of distributors worldwide.
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