Product category:
Test Accessories
News Release from: Peak Test Services | Subject: P25/Z Series
Edited by the Electronicstalk Editorial
Team on 13 January 2003
Probes get right to the point of ATE
The new P25/Z Series of spring-contact test probes has been introduced by Peak Test Services to meet the demands of greater accuracy in ATE systems for PCB testing.
The new P25/Z Series of spring-contact test probes has been introduced by Peak Test Services to meet the demands of greater accuracy in ATE systems for PCB testing The new probes are designed for testing at 0.1in centres, and achieve their accuracy through the use of an additional crimp at the top of the barrel, which optimises the point positioning
The P25/Z Series fit all existing P25 Series receptacles, and can directly replace most probes already in use on ATE fixtures.
Most of the tip styles in the standard P25 Series are available.
The probes are available directly from Peak Test Services in the UK and Ireland, and from a network of distributors worldwide.
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