Product category:
Test Accessories
News Release from: Peak Test Services | Subject: P700 and P705 Series
Edited by the Electronicstalk Editorial
Team on 30 July 2003
Micro-contact probes test fine-pitch
components
Peak Test Services has expanded its range of double-ended spring test probes with two new series designed for probing at 0.75mm centres.
Peak Test Services has expanded its range of double-ended spring test probes with two new series designed for probing at 0.75mm centres The new P700 and P705 Series are ideally suited to use in test heads and test sockets for use with fine-pitch components including BGA (ball grid array) and MCM (multichip module) packages
The probes are available with an overall length of 5.9 or 8.7mm, and have gold-plated heads in flat or four-point crown styles.
• Peak Test Services: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
