Product category:
Test Accessories
News Release from: Peak Test Services | Subject: Fine-pitch test probes
Edited by the Electronicstalk Editorial
Team on 17 October 2003
Full range of fine-pitch test probes
A number of new devices have been added to the range of fine-pitch test probes available from Peak Test Services, making it probably the most comprehensive range available in the UK.
A number of new devices have been added to the range of fine-pitch test probes available from Peak Test Services, making it probably the most comprehensive range available in the UK The range includes both single- and double-ended versions, and is ideally suited to test applications involving BGA (ball grid array), MCM (multichip module) and other fine-pitch electronic component packages
Probes are available for tests on devices at centres ranging from 1.00 down to 0.50mm.
Lengths range from 24.5 down to 5.9mm, and a choice of five tip styles is available.
A 5-page datapack has been produced by Peak Test Services, and includes full data and application guidelines for these devices.
The probes are available exclusively in the UK from Peak Test Services, or worldwide from a network of agents.
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