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Q-Star Test
Address:
Lieven Bauwensstraat 20
Brugge
B-8200
Belgium
Telephone: (Belgium) +32 50 319273
http://www.qstar.be
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Listing of all 7 news releases from Q-Star Test:
Partnership provides chip quality boost
The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow.
News from Q-Star Test (26 February 2008)
Q-Star Test partners with test service provider
Q-Star Test and DEI announce a strategic cooperation - serving the Chinese market with solutions targeting product quality improvement and test cost and time-to-volume reduction
News from Q-Star Test (14 December 2006)
Current monitor helps maintain automotive quality
User application article Rood Technology uses the QD-1010Lite IDDQ monitor product for running IDDQ tests and to enhance its test performance on automotive products as part of the production test flow.
News from Q-Star Test ( 4 May 2006)
Current monitor cuts automotive ATE costs
User application article Dialog Semiconductor uses the QD-1011 advanced quiescent supply current monitor for running IDDQ tests on its automotive products as part of its production test flow.
News from Q-Star Test ( 2 May 2006)
Transient module guarantees high defect coverage
A new measurement module enables a quick and easy application of transient current tests in a production test environment.
News from Q-Star Test ( 2 May 2006)
Monitor cuts testing costs for automotive products
User application article Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products.
News from Q-Star Test (23 September 2005)
ATE module aims to spot nanometre-scale defects
The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.
News from Q-Star Test (17 February 2004)
