RSS News Feed for Q-Star Test - from Electronicstalk http://www.electronicstalk.com/news/qst/qst000.html Q-Star Test news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Sat, 22 Nov 2008 08:00:00 UT Sat, 22 Nov 2008 08:00:00 UT Pro-Talk Ltd http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Partnership provides chip quality boost The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow. Tue, 26 Feb 2008 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst106.html Q-Star Test partners with test service provider Q-Star Test and DEI announce a strategic cooperation - serving the Chinese market with solutions targeting product quality improvement and test cost and time-to-volume reduction Thu, 14 Dec 2006 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst105.html Current monitor helps maintain automotive quality Rood Technology uses the QD-1010Lite IDDQ monitor product for running IDDQ tests and to enhance its test performance on automotive products as part of the production test flow. Thu, 04 May 2006 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst104.html Current monitor cuts automotive ATE costs Dialog Semiconductor uses the QD-1011 advanced quiescent supply current monitor for running IDDQ tests on its automotive products as part of its production test flow. Tue, 02 May 2006 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst102.html Transient module guarantees high defect coverage A new measurement module enables a quick and easy application of transient current tests in a production test environment. Tue, 02 May 2006 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst103.html Monitor cuts testing costs for automotive products Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products. Fri, 23 Sep 2005 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst101.html ATE module aims to spot nanometre-scale defects The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume. Tue, 17 Feb 2004 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst100.html