Product category:
ATE Systems
News Release from: Q-Star Test | Subject: QD-1020, multi-site IDDQ monitor
Edited by the Electronicstalk Editorial
Team on 23 September 2005
Monitor cuts testing costs for
automotive products
Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products.
Q-Star Test, a supplier of advanced, high-speed and highly accurate IDD test and measurement solutions has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020 advanced multi-site IDDQ monitor for running IDDQ tests on its automotive products as part of its production test flow Hans Manhaeve, President and CEO of Q-Star Test, noted: "We are honoured that our QD-1020 product, part of our QD-10xx family of products, has been selected by Freescale Semiconductor, a global leader in the design and manufacture of embedded semiconductors for the automotive, consumer, industrial, networking and wireless markets"
This article was originally published on Electronicstalk on 17 Feb 2004 at 8.00am (UK)
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ATE module aims to spot nanometre-scale defects
The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.
Current monitor cuts automotive ATE costs
Dialog Semiconductor uses the QD-1011 advanced quiescent supply current monitor for running IDDQ tests on its automotive products as part of its production test flow.
"Building on a previously successful application of our QI-0003 IDDQ monitor product we are happy to see that our more advanced products are now finding their way to the Freescale production test floor".
"Our relationship with Freescale-Tempe evolved significantly throughout the course of the company's evaluation process, and we look forward to working together to develop innovative new test solutions for the automotive market".
Freescale Semiconductor is employing Q-Star Test's QD-1020 to support the test of its automotive products.
Further reading
Transient module guarantees high defect coverage
A new measurement module enables a quick and easy application of transient current tests in a production test environment.
Current monitor helps maintain automotive quality
Rood Technology uses the QD-1010Lite IDDQ monitor product for running IDDQ tests and to enhance its test performance on automotive products as part of the production test flow.
Partnership provides chip quality boost
The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow.
Prior to production application, the company conducted an intensive evaluation".
"Making use of Q-Star Test's QD-1020 product allows us to reduce test costs while meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundreds of IDDQ strobe points, as well as offering us improved IDDQ data quality" stated David Prystasz, Product Engineering Test Team Leader.
Freescale Semiconductor has already begun implementing the Q-Star Test QD-1020 at its testing facilities in Arizona and a roll-out to application at its subcontractors is planned.
SoC and SiP designs are rapidly becoming preferred solutions as semiconductor manufacturers seek to optimise shrinking device geometries by squeezing greater amounts of device content and functionality onto a single chip or into a single package.
The resulting, highly integrated devices have created a new set of challenges for testing such parts within economic constraints.
For automotive parts there are the additional and increasing quality demands.
Q-Star Test is committed to develop (supply) current-based test and measurement solutions and related methodologies to address these issues.
"Customers have reported significant cost savings using our solutions while improving their product quality", added Manhaeve.
"We believe this kind of performance is paramount to ensuring chipmakers' ability to meet their aggressive product roadmap requirements".
The QD-1020 is an advanced IDDQ monitor/measurement module belonging to Q-Star Test's QD-10xx product family of advanced IDDQ measurement solutions.
The QD-1020 is a full featured, configurable quiescent supply current (IDDQ) monitor and is dedicated for multi-site applications.
Up to eight QD-1020 units can be cascaded, sharing the same control resources, minimising the number of dedicated test channels needed.
The QD-1020 module supports both standard as well as advanced IDDQ measurement strategies such as various Delta-IDDQ approaches, current ratios and relative IDDQ schemes.
The module provides digital measurement values as well as a pass/fail output signal.
on-board memory and data processing capabilities allow offloading the IDDQ data processing and decision making from the ATE to the module, implementing advanced measurement and decision making strategies (pre-stress and post-stress IDDQ, current ratios) in an easy and automated way.
The QD-1020 can be configured for measurement ranges up to 30mA, can handle switching currents up to 30A, has a high capacitive loading driving capability, offers a measurement repeatability better than 0.01% of the measurement range and has a typical IDDQ measurement time of 150us.
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