Current monitor helps maintain automotive quality

Rood Technology uses the QD-1010Lite IDDQ monitor product for running IDDQ tests and to enhance its test performance on automotive products as part of the production test flow.

Rood Technology uses the QD-1010Lite IDDQ monitor product for running IDDQ tests and to enhance its test performance on automotive products as part of the production test flow.

Hans Manhaeve, President and CEO of Q-Star Test, noted: "We are honoured that our QD-1010Lite product, part of our QD-10xx family of products, has been selected by Rood Technology, a leading European value added Service provider, specialised in providing test, qualification, failure analysis and end of line services to IC manufacturers and OEMs in the automotive, consumer, industrial, networking and wireless markets".

"Building on a previously successful evaluation process we are happy to see that our QD-1010Lite IDDQ product is now being extensively used on the Rood Technology production test floor for the test of automotive products, enabling to easily meet the stringent automotive test requirements".

"Our relationship with Rood Technology and its customer evolved significantly throughout the course of their evaluation process, and we look forward to working together to further develop innovative new test solutions for the automotive market".

Rood Technology is employing Q-Star Test's QD-1010Lite to support the test of its automotive products.

Prior to production application, the company conducted an intensive evaluation.

"Making use of Q-Star Test's QD-1010Lite product allows us to reduce test costs whilst meeting our stringent quality demands when implementing our advanced IDDQ screening methodologies that include running hundred's of IDDQ strobe points, as well as offering us improved IDDQ data quality", stated Dieter Schreiber, Marketing and Sales Manager.

Rood Technology is now fully using the Q-Star Test QD-1010Lite as part of its production test floor and a further roll-out is planned.

SoC and SiP designs are rapidly becoming preferred solutions as semiconductor manufacturers seek to optimise shrinking device geometries by squeezing greater amounts of device content and functionality onto a single chip or into a single package.

The resulting, highly integrated devices have created a new set of challenges for testing such parts within economic constraints.

For automotive parts there are the additional and increasing quality demands.

Q-Star Test is committed to develop (supply) current based test and measurement solutions and related methodologies to address these issues.

"Customers have reported significant cost savings using our solutions whilst improving their product quality", added Manhaeve.

"We believe this kind of performance is paramount to ensuring chipmakers' ability to meet their aggressive product roadmap requirements".

As the test cost are a substantial and growing part of the IC manufacturing costs, Rood Technology is active in rationalising the development process by developing a innovative software tool (Re-use of test-blocks) to reduce software development time with the result to reduce time to market.

"By using the latest state of the art IDDQ test and measuring tool, Rood is supporting its customers to reach shorter test times as well as yield improvement and herewith contributes to reach high product quality high, test performance at competitive costs", noted Schreiber.

The QD-1010Lite is a high speed high resolution IDDQ monitor/measurement module belonging to Q-Star Test's QD-10xx Product family of advanced IDDQ measurement solutions.

The QD-1010Lite is a configurable quiescent supply current (IDDQ) monitor, with basic measurement functionality and requires a minimum number of dedicated test channels.

The QD-1010Lite module supports both standard well as advanced IDDQ measurement strategies such as various delta-IDDQ approaches, current ratios and relative IDDQ schemes.

The module provides digital measurement values as well as a simple pass/fail output signal and relies on the ATE for further data processing.

The QD-1010Lite can be configured for measurement ranges up to 30mA, can handle switching currents up to 30A, has a high capacitive loading driving capability, offers measurement repeatability better than 0.01% of the measurement range and has a typical IDDQ measurement time of 200us.

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